Robust SRAM Designs and Analysis, Jawar Singh; Saraju P. Mohanty; Dhiraj K. Pradhan

Автор: Gangadharan
Название: Constraining Designs for Synthesis and Timing Analysis
ISBN: 1461432685 ISBN-13(EAN): 9781461432685
Издательство: Springer
Рейтинг:
Цена: 111790.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This guide to timing constraints in integrated circuit design shows how to maximize performance of IC designs by specifying timing requirements correctly. Coverage includes such design aspects as synthesis, static timing analysis and placement and routing.

Автор: Vibhu Sharma; Francky Catthoor; Wim Dehaene
Название: SRAM Design for Wireless Sensor Networks
ISBN: 1489992154 ISBN-13(EAN): 9781489992154
Издательство: Springer
Рейтинг:
Цена: 104480.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This reviews the most efficient circuit design techniques and trade-offs, and introduces new memory architecture techniques, sense amplifier circuits and voltage optimization methods for reducing the impact of variability in wireless sensor applications.

Автор: Andrei Pavlov; Manoj Sachdev
Название: CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
ISBN: 904817855X ISBN-13(EAN): 9789048178551
Издательство: Springer
Рейтинг:
Цена: 130590.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book covers a broad range of topics related to SRAM design and testing. It includes everything from SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing.

Автор: Koichiro Ishibashi; Kenichi Osada
Название: Low Power and Reliable SRAM Memory Cell and Array Design
ISBN: 3642270182 ISBN-13(EAN): 9783642270185
Издательство: Springer
Рейтинг:
Цена: 104480.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The recent development of advanced semiconductor device technologies is due to the success of SRAM memory cells. This book addresses issues in the design of SRAM memory cells for advanced CMOS technology, including variability, leakage and reliability.

Автор: Alberto Bosio; Luigi Dilillo; Patrick Girard; Serg
Название: Advanced Test Methods for SRAMs
ISBN: 1489983147 ISBN-13(EAN): 9781489983145
Издательство: Springer
Рейтинг:
Цена: 95770.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Valuable testing and diagnostic methods for the latest generation of static random access memory (SRAM), are presented in this comprehensive guide. New fault models are required for the latest very deep sub-micron (VDSM) technologies, and are outlined here.

Автор: Sridhar Gangadharan; Sanjay Churiwala
Название: Constraining Designs for Synthesis and Timing Analysis
ISBN: 1489989161 ISBN-13(EAN): 9781489989161
Издательство: Springer
Рейтинг:
Цена: 95770.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This guide to timing constraints in integrated circuit design shows how to maximize performance of IC designs by specifying timing requirements correctly. Coverage includes such design aspects as synthesis, static timing analysis and placement and routing.

Автор: Mohamed Abu Rahma; Mohab Anis
Название: Nanometer Variation-Tolerant SRAM
ISBN: 1493902202 ISBN-13(EAN): 9781493902200
Издательство: Springer
Рейтинг:
Цена: 104480.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This essential reference combines state-of-the-art circuit techniques and statistical methodologies to optimize SRAM performance and yield in nanometer technologies. It shows designers how to apply practical techniques that optimize memory yield.