SRAM Design for Wireless Sensor Networks, Vibhu Sharma; Francky Catthoor; Wim Dehaene

Автор: Mahmoud
Название: Networked Filtering and Fusion in Wireless Sensor Networks
ISBN: 1482250969 ISBN-13(EAN): 9781482250961
Издательство: Taylor&Francis
Рейтинг:
Цена: 137810.00 T
Наличие на складе: Невозможна поставка.
Описание:

By exploiting the synergies among available data, information fusion can reduce data traffic, filter noisy measurements, and make predictions and inferences about a monitored entity. Networked Filtering and Fusion in Wireless Sensor Networks introduces the subject of multi-sensor fusion as the method of choice for implementing distributed systems.

The book examines the state of the art in information fusion. It presents the known methods, algorithms, architectures, and models of information fusion and discusses their applicability in the context of wireless sensor networks (WSNs). Paying particular attention to the wide range of topics that have been covered in recent literature, the text presents the results of a number of typical case studies.

Complete with research supported elements and comprehensive references, this teaching-oriented volume uses standard scientific terminology, conventions, and notations throughout. It applies recently developed convex optimization theory and highly efficient algorithms in estimation fusion to open up discussion and provide researchers with an ideal starting point for further research on distributed estimation and fusion for WSNs.

The book supplies a cohesive overview of the key results of theory and applications of information-fusion-related problems in networked systems in a unified framework. Providing advanced mathematical treatment of fundamental problems with information fusion, it will help you broaden your understanding of prospective applications and how to address such problems in practice.

After reading the book, you will gain the understanding required to model parts of dynamic systems and use those models to develop distributed fusion control algorithms that are based on feedback control theory.

Автор: Andrei Pavlov; Manoj Sachdev
Название: CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
ISBN: 904817855X ISBN-13(EAN): 9789048178551
Издательство: Springer
Рейтинг:
Цена: 130590.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book covers a broad range of topics related to SRAM design and testing. It includes everything from SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing.

Автор: Koichiro Ishibashi; Kenichi Osada
Название: Low Power and Reliable SRAM Memory Cell and Array Design
ISBN: 3642270182 ISBN-13(EAN): 9783642270185
Издательство: Springer
Рейтинг:
Цена: 104480.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The recent development of advanced semiconductor device technologies is due to the success of SRAM memory cells. This book addresses issues in the design of SRAM memory cells for advanced CMOS technology, including variability, leakage and reliability.

Автор: Mohamed Abu Rahma; Mohab Anis
Название: Nanometer Variation-Tolerant SRAM
ISBN: 1493902202 ISBN-13(EAN): 9781493902200
Издательство: Springer
Рейтинг:
Цена: 104480.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This essential reference combines state-of-the-art circuit techniques and statistical methodologies to optimize SRAM performance and yield in nanometer technologies. It shows designers how to apply practical techniques that optimize memory yield.

Автор: Jawar Singh; Saraju P. Mohanty; Dhiraj K. Pradhan
Название: Robust SRAM Designs and Analysis
ISBN: 149390244X ISBN-13(EAN): 9781493902446
Издательство: Springer
Рейтинг:
Цена: 104480.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This guide to Static Random Access Memory (SRAM) bitcell design and analysis meets the nano-regime challenges for CMOS devices and such emerging devices as Tunnel FETs. Offers popular SRAM bitcell topologies that mitigate variability, plus exhaustive analysis.