Mass Metrology: The Newly Defined Kilogram, Gupta S. V.

Автор: Graham T. Smith
Название: Industrial Metrology
ISBN: 1849968780 ISBN-13(EAN): 9781849968782
Издательство: Springer
Рейтинг:
Цена: 191550.00 T
Наличие на складе: Нет в наличии.
Описание: The subject of this book is surface metrology, in particular two major aspects: surface texture and roundness. Traditionally surface metrology usage has been dictated by engineers who have served long and demanding apprenticeships, usually in parallel with studies leading to technician-level qualifications.

Автор: Grabe Michael
Название: Truth and Traceability in Physics and Metrology
ISBN: 1643270982 ISBN-13(EAN): 9781643270982
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 25080.00 T
Наличие на складе: Поставка под заказ.

Автор: Grabe, Michael
Название: Truth and traceability in physics and metrology
ISBN: 1643270974 ISBN-13(EAN): 9781643270975
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 61910.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Discusses a new error concept dispensing with the common practice to randomize unknown systematic errors. Instead, unknown systematic errors are treated as what they physically are - namely as constants being unknown with respect to magnitude and sign.

Автор: Bulska Ewa
Название: Metrology in Chemistry
ISBN: 3030075761 ISBN-13(EAN): 9783030075767
Издательство: Springer
Рейтинг:
Цена: 79190.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: In this concise book, the author presents the essentials every chemist needs to know about how to obtain reliable measurement results. Starting with the basics of metrology and the metrological infrastructure, all relevant topics - such as traceability, calibration, chemical reference materials, validation and uncertainty - are covered.

Автор: Xavier Silvani
Название: Metrology for Fire Experiments in Outdoor Conditions
ISBN: 1461479614 ISBN-13(EAN): 9781461479611
Издательство: Springer
Рейтинг:
Цена: 43530.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Natural fires can be considered as scale-dependant, non-linear processes of mass, momentum and heat transport, resulting from a turbulent reactive and radiative fluid medium flowing over a complex medium, the vegetal fuel.

Автор: Y Zhao; T Kramer; Robert Brown; Xun Xu
Название: Information Modeling for Interoperable Dimensional Metrology
ISBN: 1447160290 ISBN-13(EAN): 9781447160298
Издательство: Springer
Рейтинг:
Цена: 121890.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book analyzes interoperability issues in dimensional metrology systems and describes information modeling techniques. Coverage includes theory, techniques and key technologies, and explores new approaches for solving real-world interoperability problems.

Автор: Hockett, Paul
Название: Quantum metrology with photoelectrons, volume ii: applications and advances
ISBN: 1643270001 ISBN-13(EAN): 9781643270005
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 76690.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging applications.Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on ""complete"" photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.

Автор: Krishnan, Kannan M.
Название: Principles of Materials Characterization and Metrology
ISBN: 0198830262 ISBN-13(EAN): 9780198830269
Издательство: Oxford Academ
Рейтинг:
Цена: 46980.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book provides a comprehensive introduction to the principles of materials characterization and metrology. Based on several decades of teaching experience, it includes many worked examples, questions and exercises, suitable for students at the undergraduate or beginning graduate level.

Автор: S. V. Gupta
Название: Mass Metrology
ISBN: 3030124649 ISBN-13(EAN): 9783030124649
Издательство: Springer
Рейтинг:
Цена: 121110.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This second edition of Mass Metrology: The Newly Defined Kilogram has been thoroughly revised to reflect the recent redefinition of the kilogram in terms of Planck’s constant. The necessity of defining the kilogram in terms of physical constants was already underscored in the first edition. However, the kilogram can also be defined in terms of Avogadro’s number, using a collection of ions of heavy elements, by the levitation method, or using voltage and watt balances. The book also addresses the concepts of gravitational, inertial and conventional mass, and describes in detail the variation of acceleration due to gravity. Further topics covered in this second edition include: the effect of gravity variations on the reading of electronic balances derived with respect to latitude, altitude and earth topography; the classification of weights by the OIML; and maximum permissible error in different categories of weights prescribed by national and international organizations. The book also discusses group weighing techniques and the use of nanotechnology for the detection of mass differences as small as 10-24 g. Last but not least, readers will find details on the XRCD method for defining the kilogram in terms of Planck’s constant.

Автор: Grabe, Michael
Название: Truth and traceability in physics and metrology
ISBN: 1643270931 ISBN-13(EAN): 9781643270937
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 41580.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Metrological data is known to be blurred by the imperfections of the measuring process. In retrospect, for about two centuries regular or constant errors were no focal point of experimental activities, only irregular or random error were. Today's notation of unknown systematic errors is in line with this. Confusingly enough, the worldwide practiced approach to belatedly admit those unknown systematic errors amounts to consider them as being random, too. This book discusses a new error concept dispensing with the common practice to randomize unknown systematic errors. Instead, unknown systematic errors will be treated as what they physically are- namely as constants being unknown with respect to magnitude and sign. The ideas considered in this book issue a proceeding steadily localizing the true values of the measurands and consequently traceability.

Автор: Aswal Dinesh K.
Название: Metrology for Inclusive Growth of India
ISBN: 9811588716 ISBN-13(EAN): 9789811588716
Издательство: Springer
Цена: 139750.00 T
Наличие на складе: Нет в наличии.
Описание: This book describes the significance of metrology for inclusive growth in India and explains its application in the areas of physical-mechanical engineering, electrical and electronics, Indian standard time measurements, electromagnetic radiation, environment, biomedical, materials and Bhartiya Nirdeshak Dravyas (BND (R)).

Автор: Tom Proulx
Название: Optical Measurements, Modeling, and Metrology, Volume 5
ISBN: 1461429056 ISBN-13(EAN): 9781461429050
Издательство: Springer
Рейтинг:
Цена: 243800.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Optical Measurements, Modeling, and Metrology represents one of eight volumes of technical papers presented at the Society for Experimental Mechanics Annual Conference on Experimental and Applied Mechanics, held at Uncasville, Connecticut, June 13-16, 2011.