Metrology and Theory of Measurement, Valery A. Slaev, Anna G. Chunovkina, Leonid A. Mironovsky

Автор: Raghavendra, N V; Krishnamurthy, L
Название: Engineering Metrology and Measurements
ISBN: 0198085494 ISBN-13(EAN): 9780198085492
Издательство: Oxford Academ
Цена: 31670.00 T
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Описание: Engineering Metrology and Measurements is a textbook designed for students of mechanical, production and allied disciplines to facilitate learning of various shop-floor measurement techniques and also understand the basics of mechanical measurements.

Автор: Mansfield
Название: Metrology and Standardization of Nanotechnology - Protocols and Industrial Innovations
ISBN: 3527340394 ISBN-13(EAN): 9783527340392
Издательство: Wiley
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Цена: 180520.00 T
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Описание: Meeting the need for a reliable handbook on pertinent metrology approaches in nanomaterials, experts from European, American and Asian standardization bodies provide a balanced and comprehensive overview of the state of the art, highlighting the importance of global standards.

Автор: Grabe, Michael
Название: Truth and traceability in physics and metrology
ISBN: 1643270931 ISBN-13(EAN): 9781643270937
Издательство: Mare Nostrum (Eurospan)
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Цена: 41580.00 T
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Описание: Metrological data is known to be blurred by the imperfections of the measuring process. In retrospect, for about two centuries regular or constant errors were no focal point of experimental activities, only irregular or random error were. Today's notation of unknown systematic errors is in line with this. Confusingly enough, the worldwide practiced approach to belatedly admit those unknown systematic errors amounts to consider them as being random, too. This book discusses a new error concept dispensing with the common practice to randomize unknown systematic errors. Instead, unknown systematic errors will be treated as what they physically are- namely as constants being unknown with respect to magnitude and sign. The ideas considered in this book issue a proceeding steadily localizing the true values of the measurands and consequently traceability.

Автор: Grabe, Michael
Название: Truth and traceability in physics and metrology
ISBN: 1643270974 ISBN-13(EAN): 9781643270975
Издательство: Mare Nostrum (Eurospan)
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Цена: 61910.00 T
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Описание: Discusses a new error concept dispensing with the common practice to randomize unknown systematic errors. Instead, unknown systematic errors are treated as what they physically are - namely as constants being unknown with respect to magnitude and sign.

Автор: Chander Prakash; Sunpreet Singh
Название: Characterization, Testing, Measurement, and Metrology
ISBN: 0367275155 ISBN-13(EAN): 9780367275150
Издательство: Taylor&Francis
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Цена: 188850.00 T
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Описание: As the field of materials and manufacturing has progressed tremendously, there is a need for up-to-date knowledge with respect to the latest novelties, techniques and applications.

Автор: French College
Название: Metrology in Industry: The Key for Quality
ISBN: 1905209517 ISBN-13(EAN): 9781905209514
Издательство: Wiley
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Цена: 146730.00 T
Наличие на складе: Поставка под заказ.
Описание: Metrology is an integral part of the structure of today`s world: navigation and telecommunications require highly accurate time and frequency standards; human health and safety relies on authoritative measurements in diagnosis and treatment, as does food production and trade; global climate studies also depend on reliable and consistent data.

Автор: Hockett, Paul
Название: Quantum metrology with photoelectrons, volume ii: applications and advances
ISBN: 1681746891 ISBN-13(EAN): 9781681746890
Издательство: Mare Nostrum (Eurospan)
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Цена: 56370.00 T
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Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging applications.Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on ""complete"" photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.

Автор: Hockett, Paul
Название: Quantum metrology with photoelectrons, volume ii: applications and advances
ISBN: 1643270001 ISBN-13(EAN): 9781643270005
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 76690.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging applications.Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on ""complete"" photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.

Автор: Hockett, Paul
Название: Quantum metrology with photoelectrons, volume i: foundations
ISBN: 1681749998 ISBN-13(EAN): 9781681749990
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 92400.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 1: Foundations discusses the fundamental concepts along with recent and emerging applications.The core physics is that of photoionization, and Volume 1 addresses this topic. The foundational material is presented in part as a tutorial with extensive numerical examples and also in part as a collected reference to the relevant theoretical treatments from the literature for a range of cases. Topics are discussed with an eye to developing general quantum metrology schemes, in which full quantum state reconstruction of the photoelectron wavefunction is the goal. In many cases, code and/or additional resources are available online. Consequently, it is hoped that readers at all levels will find something of interest and that the material provides something rather different from existing textbooks.

Автор: Hockett, Paul
Название: Quantum metrology with photoelectrons, volume i: foundations
ISBN: 1681746859 ISBN-13(EAN): 9781681746852
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 72070.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 1: Foundations discusses the fundamental concepts along with recent and emerging applications.The core physics is that of photoionization, and Volume 1 addresses this topic. The foundational material is presented in part as a tutorial with extensive numerical examples and also in part as a collected reference to the relevant theoretical treatments from the literature for a range of cases. Topics are discussed with an eye to developing general quantum metrology schemes, in which full quantum state reconstruction of the photoelectron wavefunction is the goal. In many cases, code and/or additional resources are available online. Consequently, it is hoped that readers at all levels will find something of interest and that the material provides something rather different from existing textbooks.

Автор: Valery A. Slaev, Anna G. Chunovkina, Leonid A. Mironovsky
Название: Metrology and Theory of Measurement
ISBN: 3110650940 ISBN-13(EAN): 9783110650945
Издательство: Walter de Gruyter
Цена: 204490.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The series Texts and Monographs in Theoretical Physics collects advanced texts on selected topics from the broad and varied field of Theoretical Physics. The works in the series will enable the readers to get a deep understanding of current topics in Theoretical Physics, with a special emphasis on recent developments. They are aimed at advanced students and researchers in theoretical and mathematical physics, and can also serve as secondary reading for lectures and seminars at post-graduate levels.

Автор: Viacheslav Karmalita
Название: Metrology of Automated Tests: Static and Dynamic Characteristics
ISBN: 3110666642 ISBN-13(EAN): 9783110666649
Издательство: Walter de Gruyter
Цена: 86720.00 T
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Описание:

This book offers an in-depth discussion related to metrological aspects of automated tests. The accuracy of experimental estimates of test object performance is examined from the standpoint of their statistical variance and systematic biases.