Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII, Stephen O`Dell, Giovanni Pareschi

Автор: Stephen L. O`Deill, Giovanni Pareschi
Название: Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
ISBN: 1510612556 ISBN-13(EAN): 9781510612556
Издательство: Mare Nostrum (Eurospan)
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Oswald H. Siegmund
Название: UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XX
ISBN: 1510612513 ISBN-13(EAN): 9781510612518
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Oswald Siegmund
Название: UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XIX
ISBN: 1628417676 ISBN-13(EAN): 9781628417678
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Jan-Willem den Herder, Kazuhiro Nakazawa
Название: Space Telescopes and Instrumentation 2018: Ultraviolet to Gamma Ray
ISBN: 1510619518 ISBN-13(EAN): 9781510619517
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Stephen Payne, Ralph James, Arnold Burger, Michael Fiederle
Название: Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XX
ISBN: 1510620958 ISBN-13(EAN): 9781510620957
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Lahsen Assoufid, Haruhiko Ohashi, Anand Krishna Asundi
Название: Advances in Metrology for X-Ray and EUV Optics VII
ISBN: 1510612270 ISBN-13(EAN): 9781510612273
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Larry Franks, Ralph James, Michael Fiederle, Arnold Burger
Название: Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVII
ISBN: 1628417595 ISBN-13(EAN): 9781628417593
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Ralph B. James, Michael Fiederle, Arnold Burger, Larry Franks
Название: Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVIII
ISBN: 1510603271 ISBN-13(EAN): 9781510603271
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Arnold Burger, Ralph James, Michael Fiederle, Larry Franks
Название: Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIX
ISBN: 1510612416 ISBN-13(EAN): 9781510612419
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Ralph B. James
Название: Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIV
ISBN: 0819492248 ISBN-13(EAN): 9780819492241
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Shunji Goto, Christian Morawe, Ali Khounsary
Название: Advances in X-Ray/EUV Optics and Components X
ISBN: 1628417544 ISBN-13(EAN): 9781628417548
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Jan-Willem den Herder, Tadayuki Takahashi, Marshall Bautz
Название: Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray
ISBN: 1510601899 ISBN-13(EAN): 9781510601895
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.