Slow Light, Fast Light, and Opto-Atomic Precision Metrology IX, Selim M. Shahriar

Автор: Kevin Harding, Song Zhang
Название: Dimensional Optical Metrology and Inspection for Practical Applications V
ISBN: 1510601090 ISBN-13(EAN): 9781510601093
Издательство: Mare Nostrum (Eurospan)
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Selim Shahriar, Jacob Scheuer
Название: Slow Light, Fast Light, and Opto-Atomic Precision Metrology X
ISBN: 1510606793 ISBN-13(EAN): 9781510606791
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Selim Shahriar, Jacob Scheuer
Название: Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI
ISBN: 1510615814 ISBN-13(EAN): 9781510615816
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Lahsen Assoufid, Haruhiko Ohashi, Anand Krishna Asundi
Название: Advances in Metrology for X-Ray and EUV Optics VII
ISBN: 1510612270 ISBN-13(EAN): 9781510612273
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Sen Han, Toru Yoshizawa, Song Zhang
Название: Optical Metrology and Inspection for Industrial Applications IV
ISBN: 1510604650 ISBN-13(EAN): 9781510604650
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Annette T. Torres, Fernando Mendoza Santoyo, Eugenio R. Mendez
Название: SPECKLE 2015: VI International Conference on Speckle Metrology
ISBN: 1628418788 ISBN-13(EAN): 9781628418781
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Bernd Bodermann, Karsten Frenner, Richard M. Silver
Название: Modeling Aspects in Optical Metrology VI
ISBN: 1510611053 ISBN-13(EAN): 9781510611054
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Malgorzata Kujawi?ska, Leszek Jaroszewicz
Название: Speckle 2018: VII International Conference on Speckle Metrology
ISBN: 1510622977 ISBN-13(EAN): 9781510622975
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.