Improvement of the Reliability and Accuracy of Heavy Ion Beam Analysis, 

Автор: Otto Meyer
Название: Ion Beam Surface Layer Analysis
ISBN: 1461588812 ISBN-13(EAN): 9781461588818
Издательство: Springer
Рейтинг:
Цена: 81050.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The major topic of that and the present conference was the material analysis with ion beams including backscattering and channeling, nuclear reactions and ion induced X-rays with emphasis on technical problems and no- vel applications.

Название: Development of a Reference Database for Ion Beam Analysis : Report of a Coordinated Research Project on Reference Database for Ion Beam Analysis
ISBN: 9201105150 ISBN-13(EAN): 9789201105158
Издательство: Mare Nostrum (Eurospan)
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Цена: 17550.00 T
Наличие на складе: Невозможна поставка.
Описание: Ion beam analysis techniques are non-destructive analytical techniques used to identify the composition and provide elemental depth profiles in surface layers of materials. The applications of such techniques are diverse and include environmental control, cultural heritage and conservation and fusion technologies. Their reliability and accuracy depends strongly on our knowledge of the nuclear reaction cross sections, and this publication describes the coordinated effort to measure, compile and evaluate cross section data relevant to these techniques and make these data available to the user community through a comprehensive online database. It includes detailed assessments of experimental cross sections as well as attempts to benchmark these data against appropriate integral measurements.

Автор: Otto Meyer
Название: Ion Beam Surface Layer Analysis
ISBN: 1461588782 ISBN-13(EAN): 9781461588788
Издательство: Springer
Рейтинг:
Цена: 46570.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The major topic of that and the present conference was the material analysis with ion beams including backscattering and channeling, nuclear reactions and ion induced X-rays with emphasis on technical problems and no- vel applications.