Advanced Laser Processing and Manufacturing II, Minghui Hong, Jian Liu

Автор: Minlin Zhong, Jonathan Lawrence, Minghui Hong, Jian Liu
Название: Advanced Laser Processing and Manufacturing
ISBN: 1510604553 ISBN-13(EAN): 9781510604551
Издательство: Mare Nostrum (Eurospan)
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Minghui Hong, Lan Jiang
Название: AOPC 2015: Micro/Nano Optical Manufacturing Technologies; and Laser Processing and Rapid Prototyping Techniques
ISBN: 1628418982 ISBN-13(EAN): 9781628418989
Издательство: Mare Nostrum (Eurospan)
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Bingheng Lu, Huaming Wang
Название: Advanced Laser Manufacturing Technology
ISBN: 1510607641 ISBN-13(EAN): 9781510607644
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Andrea Camposeo, Yuris Dzenis, Maria Farsari, Luana Persano
Название: Advanced Manufacturing Technologies for Micro- and Nanosystems in Security and Defence
ISBN: 1510621911 ISBN-13(EAN): 9781510621916
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Min Xu, Ji Yang
Название: Advanced Optical Design and Manufacturing Technology and Astronomical Telescopes and Instrumentation
ISBN: 1510607668 ISBN-13(EAN): 9781510607668
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Shinan Qian, Mourad Idir, Daniele Cocco, Tigiao Xiao, Kazuto Yamauchi
Название: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics
ISBN: 1628419229 ISBN-13(EAN): 9781628419221
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Myung K. Cho, Bin Fan
Название: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes
ISBN: 1628419172 ISBN-13(EAN): 9781628419177
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Wenhan Jiang, Li Yang, Oltmann Riemer, Shengyi Li, Yongjian Wan
Название: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advances Optical Manufacturing Technologies
ISBN: 1628419180 ISBN-13(EAN): 9781628419184
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Xiangang Luo, Tianchun Ye, Song Hu, Minghui Hong, Min Gu, Tingwen Xin
Название: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems; and Smart Structures and Materials
ISBN: 1628419202 ISBN-13(EAN): 9781628419207
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Yadong Jiang, Bernard Kippelen, Junsheng Yu
Название: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices
ISBN: 1628419210 ISBN-13(EAN): 9781628419214
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.