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Global Intelligence Industry Conference (GIIC 2018), Yueguang Lv


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Автор: Yueguang Lv
Название:  Global Intelligence Industry Conference (GIIC 2018)
ISBN: 9781510622999
Издательство: Mare Nostrum (Eurospan)
Классификация:
ISBN-10: 1510622993
Обложка/Формат: Paperback
Страницы: 406
Вес: 0.00 кг.
Дата издания: 30.09.2018
Серия: Proceedings of spie
Язык: English
Размер: 279 x 216
Читательская аудитория: Professional and scholarly
Ключевые слова: Applied optics
Рейтинг:
Поставляется из: Англии
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Yingjie Yu, Chao Zuo, Kemao Qian
Название: Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018)
ISBN: 151062256X ISBN-13(EAN): 9781510622562
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 168170.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Ruidan Su
Название: 2018 International Conference on Image and Video Processing, and Artificial Intelligence
ISBN: 1510623108 ISBN-13(EAN): 9781510623101
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 107190.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Kurt Ronse, Eric Hendrickx, Patrick Naulleau, Paolo Gargini, Toshiro Itani
Название: International Conference on Extreme Ultraviolet Lithography 2018
ISBN: 1510622136 ISBN-13(EAN): 9781510622135
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 134910.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Malgorzata Kujawi?ska, Leszek Jaroszewicz
Название: Speckle 2018: VII International Conference on Speckle Metrology
ISBN: 1510622977 ISBN-13(EAN): 9781510622975
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 134910.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Xudong Jiang, Jenq-Neng Hwang
Название: Tenth International Conference on Digital Image Processing (ICDIP 2018)
ISBN: 1510621997 ISBN-13(EAN): 9781510621992
Издательство: Mare Nostrum (Eurospan)
Рейтинг:
Цена: 259650.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.


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