System Test and Diagnosis, William R. Simpson; John W. Sheppard

Автор: Mohammad Tehranipoor; Ke Peng; Krishnendu Chakraba
Название: Test and Diagnosis for Small-Delay Defects
ISBN: 1489989528 ISBN-13(EAN): 9781489989529
Издательство: Springer
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Цена: 104480.00 T
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Описание: This book introduces new techniques for detecting and diagnosing small-delay defects in integrated circuits. It details effective and scalable methodologies for screening and diagnosing small-delay defects.

Автор: Vikram Iyengar; Anshuman Chandra
Название: Test Resource Partitioning for System-on-a-Chip
ISBN: 1461354005 ISBN-13(EAN): 9781461354000
Издательство: Springer
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Цена: 93160.00 T
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Автор: Borutzky Wolfgang
Название: Bond Graph Model-Based Fault Diagnosis of Hybrid Systems
ISBN: 3319118595 ISBN-13(EAN): 9783319118598
Издательство: Springer
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Цена: 121890.00 T
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Описание: This book presents bond graph model-based fault detection with a focus on hybrid system models. The book addresses model design, simulation, control and model-based fault diagnosis of multidisciplinary engineering systems. The text beings with a brief survey of the state-of-the-art, then focuses on hybrid systems.

Автор: John W. Sheppard; William R. Simpson
Название: Research Perspectives and Case Studies in System Test and Diagnosis
ISBN: 0792382633 ISBN-13(EAN): 9780792382638
Издательство: Springer
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Цена: 181630.00 T
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Описание: System level testing is driven by the incessant march of complexity. System approaches embody the partitioning of problems into smaller inter-related subsystems that can be solved together. This title includes the works that are an outgrowth of the 2nd International Workshop on System Test and Diagnosis held in Alexandria, Virginia in April 1998.

Автор: William R. Simpson; John W. Sheppard
Название: System Test and Diagnosis
ISBN: 146136163X ISBN-13(EAN): 9781461361633
Издательство: Springer
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Цена: 139750.00 T
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Описание: System Test and Diagnosis is the first book on test and diagnosis at the system level, defined as any aggregation of related elements that together form an entity of sufficient complexity for which it is impractical to treat all of the elements at the lowest level of detail.

Автор: Benoit Nadeau-Dostie
Название: Design for AT-Speed Test, Diagnosis and Measurement
ISBN: 0792386698 ISBN-13(EAN): 9780792386698
Издательство: Springer
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Цена: 156720.00 T
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Описание: Offers practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. This book contains a complete design flow and analysis of the impact of embedded test on a design.

Автор: Benoit Nadeau-Dostie
Название: Design for AT-Speed Test, Diagnosis and Measurement
ISBN: 1475782918 ISBN-13(EAN): 9781475782912
Издательство: Springer
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Цена: 139750.00 T
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Описание: Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels.

Автор: Zainalabedin Navabi
Название: Digital System Test and Testable Design
ISBN: 1489979271 ISBN-13(EAN): 9781489979278
Издательство: Springer
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Цена: 65290.00 T
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Описание: Using Verilog models and test benches for implementing and explaining fault simulation and test generation algorithms, this book treats the concepts of testing and testability in digital systems, and also covers digital design practices and methodologies.

Автор: Vikram Iyengar; Anshuman Chandra
Название: Test Resource Partitioning for System-on-a-Chip
ISBN: 1402071191 ISBN-13(EAN): 9781402071195
Издательство: Springer
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Цена: 158380.00 T
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Описание: Talks about test resource partitioning and optimization techniques for plug-and-play system-on-a-chip (SOC) test automation. This book aims to position test resource partitioning in the context of SOC test automation. It presents various techniques for the partitioning and optimization of the three major SOC test resources.

Автор: Ding Steven X
Название: Model-Based Fault Diagnosis Techniques
ISBN: 1447147987 ISBN-13(EAN): 9781447147985
Издательство: Springer
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Цена: 204970.00 T
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Описание: This book gives readers a framework of model-based FDI techniques, helping them to become familiar with the basic ideas and schemes in a systematic way. Examples and benchmarks provide a means of practising the ideas and judging the methods described.

Автор: Erik Larsson
Название: Introduction to Advanced System-on-Chip Test Design and Optimization
ISBN: 1441952691 ISBN-13(EAN): 9781441952691
Издательство: Springer
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Цена: 174130.00 T
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Описание: SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling.

Автор: Krishnendu Chakrabarty
Название: SOC (System-on-a-Chip) Testing for Plug and Play Test Automation
ISBN: 1441953078 ISBN-13(EAN): 9781441953070
Издательство: Springer
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Цена: 158380.00 T
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Описание: Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing.