Автор: Gerd Kaupp Название: Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching ISBN: 3642066631 ISBN-13(EAN): 9783642066634 Издательство: Springer Рейтинг: Цена: 174130.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm.
Автор: Reifenberger Ronald Название: Fundamentals of Atomic Force Microscopy - Part I: Foundations ISBN: 9814630349 ISBN-13(EAN): 9789814630344 Издательство: World Scientific Publishing Рейтинг: Цена: 100320.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM. Useful as a study guide to “Fundamentals of AFM”, an online video course available at https: //nanohub.org/courses/AFM1/Suitable for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online videos)
Автор: Reifenberger Ronald G Название: Fundamentals Of Atomic Force Microscopy - Part I: Foundations ISBN: 9814630357 ISBN-13(EAN): 9789814630351 Издательство: World Scientific Publishing Рейтинг: Цена: 42240.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM. Useful as a study guide to “Fundamentals of AFM”, an online video course available at https://nanohub.org/courses/AFM1/Suitable for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online videos)
Автор: S. Morita; Roland Wiesendanger; E. Meyer Название: Noncontact Atomic Force Microscopy ISBN: 3642627722 ISBN-13(EAN): 9783642627729 Издательство: Springer Рейтинг: Цена: 174150.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS);
Автор: Samuel H. Cohen; Marcia L. Lightbody Название: Atomic Force Microscopy/Scanning Tunneling Microscopy 3 ISBN: 1475781849 ISBN-13(EAN): 9781475781847 Издательство: Springer Рейтинг: Цена: 130610.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: The Foundation for Advances in Medicine and Science (FAMS), the organizers of SCANNING 98, sponsored its third annual Atomic Force Microscopy/Scanning Tunneling Microscopy Symposium at the Omni Inner Harbor Hotelin Baltimore, Maryland, from May 9 to 12, 1998.
Автор: Wright Kate Название: Scientific Researches in Atomic Force Microscopy ISBN: 1632384094 ISBN-13(EAN): 9781632384096 Издательство: Неизвестно Цена: 153270.00 T Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Samuel H. Cohen; Marcia L. Lightbody Название: Atomic Force Microscopy/Scanning Tunneling Microscopy 2 ISBN: 1475793278 ISBN-13(EAN): 9781475793277 Издательство: Springer Рейтинг: Цена: 130610.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Proceedings of the Second Symposium held in Natick, Massachusetts, June7-9, 1994
Автор: M.T. Bray; Samuel H. Cohen; Marcia L. Lightbody Название: Atomic Force Microscopy/Scanning Tunneling Microscopy ISBN: 1475793243 ISBN-13(EAN): 9781475793246 Издательство: Springer Рейтинг: Цена: 174150.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: In the first session, Biological Nanostructure, topics ranged from AFM ofDNA to STM imagmg ofthe biomoleeule tubulin and bacterialluciferase to the AFM of starch polymer double helices to AFM imaging of food surfaces.
Автор: Jill Guyonnet Название: Ferroelectric Domain Walls ISBN: 3319057499 ISBN-13(EAN): 9783319057491 Издательство: Springer Рейтинг: Цена: 121110.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Using the nano metric resolution of atomic force microscopy techniques, this work explores the rich fundamental physics and novel functionalities of domain walls in ferroelectric materials, the nano scale interfaces separating regions of differently oriented spontaneous polarization.
Автор: Seizo Morita; Franz J. Giessibl; Ernst Meyer; Rola Название: Noncontact Atomic Force Microscopy ISBN: 3319155873 ISBN-13(EAN): 9783319155876 Издательство: Springer Рейтинг: Цена: 130610.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Noncontact Atomic Force Microscopy
Автор: Mi Li Название: Investigations of Cellular and Molecular Biophysical Properties by Atomic Force Microscopy Nanorobotics ISBN: 9811068283 ISBN-13(EAN): 9789811068287 Издательство: Springer Рейтинг: Цена: 102480.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Introduction.- Immobilization methods for observing living cells.- Label-free measuring the mechanics of single cells.- Single-molecule recognition and force measurements.- Mapping membrane proteins on cell surface.- Applications of single-cell and single-molecule physiological properties characterization methods in clinical lymphoma treatment.- Conclusion.
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