Автор: Banerjee Roy, Nabamita , Bhattacharya, Kesab Название: Application of Signal Processing Tools and Neural Network in Diagnosis of Power System Faults ISBN: 0367431130 ISBN-13(EAN): 9780367431136 Издательство: Taylor&Francis Рейтинг: Цена: 117390.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Accurate, fast, and reliable fault classification techniques are an important operational requirement in modern-day power transmission systems. This book gives an elaboration of the power system faults and the conventional techniques of fault analysis.
Автор: Jitendra B. Khare; Wojciech Maly Название: From Contamination to Defects, Faults and Yield Loss ISBN: 146128595X ISBN-13(EAN): 9781461285953 Издательство: Springer Рейтинг: Цена: 113190.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield.
Автор: Hou, Yunhe Название: Electrical power transmission system engineering ISBN: 0367655047 ISBN-13(EAN): 9780367655044 Издательство: Taylor&Francis Рейтинг: Цена: 122490.00 T Наличие на складе: Нет в наличии.
Автор: Kim Chan-ki, Moon Seung-il, Hur Kyeon, Kim Jang-mok, Jang Gilsoo Название: Hvdc Transmission +1: Mmc Based Vsc Technology In Power Systems ISBN: 9811212295 ISBN-13(EAN): 9789811212291 Издательство: World Scientific Publishing Рейтинг: Цена: 142560.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: HVDC grids and super grids have sparked so much interest these days that researchers and engineers across the globe are talking about them, studying them, supporting them, or questioning them. This book provides valuable information for researchers, industry, and policy makers. It explains why HVDC is favorable over AC technologies for power transmission; what the key technologies and challenges are for developing an HVDC grid; how an HVDC grid will be designed and operated; and how future HVDC grids will evolve. The book also devotes significant attention to nontechnical aspects such as the influence of energy policy and regulatory frameworks.This book is a result of collaboration between industry and academia. It provides theoretical insights into the design and control of MMC technology and investigates practical aspects of the project planning, design, manufacture, implementation, and commissioning of MMC-HVDC and multi-terminal HVDC transmission technologies; filling the knowledge gap between the technology specialists and VSC-HVDC project developers and key personnel involved in those projects.
Автор: Ten, Chee-Wooi ; Hou, Yunhe Название: Modern Power System Analysis ISBN: 0367655063 ISBN-13(EAN): 9780367655068 Издательство: Taylor&Francis Рейтинг: Цена: 137810.00 T Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Domнnguez-Garcнa Alejandro D. Название: Large-Scale System Analysis Under Uncertainty: With Electric Power Applications ISBN: 1107192080 ISBN-13(EAN): 9781107192089 Издательство: Cambridge University Press Рейтинг: Цена: 122460.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Provides a comprehensive set of tools and techniques for analyzing the impact of uncertainty on large-scale engineered systems. Showcases applications for real-world problems, in areas such as renewable-based power generation, and microgrids. Essential reading for academic researchers and graduate students.
Автор: Mrozek Название: Multi-run Memory Tests for Pattern Sensitive Faults ISBN: 3319912038 ISBN-13(EAN): 9783319912035 Издательство: Springer Рейтинг: Цена: 46570.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail.
Автор: Jitendra B. Khare; Wojciech Maly Название: From Contamination to Defects, Faults and Yield Loss ISBN: 0792397142 ISBN-13(EAN): 9780792397144 Издательство: Springer Рейтинг: Цена: 130610.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield.
Автор: Ireneusz Mrozek Название: Multi-run Memory Tests for Pattern Sensitive Faults ISBN: 3030081982 ISBN-13(EAN): 9783030081980 Издательство: Springer Рейтинг: Цена: 83850.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations.Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process;Presents practical algorithms for design and implementation of efficient multi-run tests;Demonstrates methods verified by analytical and experimental investigations.
Автор: S. Jayanthy; M.C. Bhuvaneswari Название: Test Generation of Crosstalk Delay Faults in VLSI Circuits ISBN: 9811324921 ISBN-13(EAN): 9789811324925 Издательство: Springer Рейтинг: Цена: 130430.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание:
This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.
Автор: Jos? Rodrigo Azambuja; Fernanda Kastensmidt; J?rge Название: Hybrid Fault Tolerance Techniques to Detect Transient Faults in Embedded Processors ISBN: 3319359975 ISBN-13(EAN): 9783319359977 Издательство: Springer Рейтинг: Цена: 95770.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book describes fault tolerance techniques based on software and hardware to create hybrid techniques. The authors then discuss the best trade-off between software-based and hardware-based techniques and introduce novel hybrid techniques.
Казахстан, 010000 г. Астана, проспект Туран 43/5, НП2 (офис 2) ТОО "Логобук" Тел:+7 707 857-29-98 ,+7(7172) 65-23-70 www.logobook.kz
