Polyamide Thin Film Composite Membranes for Water Applications: Advanced Characterization Techniques, Khoo, Shirley Ying Siew ; Oor, Jia Zheng ; Lau, Wo

Автор: Othman,Mohd Hafiz Dzarfan
Название: Advanced Ceramics For Photocatalytic Membranes
ISBN: 0323954189 ISBN-13(EAN): 9780323954181
Издательство: Elsevier Science
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Автор: Kanellopoulos, Nick
Название: Nanoporous Materials
ISBN: 1439811040 ISBN-13(EAN): 9781439811047
Издательство: Taylor&Francis
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Цена: 265410.00 T
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Автор: Roberto
Название: Advanced Photon and Particle Techniques for the Characterization of Defects in Solids
ISBN: 1107405661 ISBN-13(EAN): 9781107405660
Издательство: Cambridge Academ
Цена: 28510.00 T
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Описание: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Автор: Carlsson, Leif A.
Название: Experimental Characterization of Advanced Composite Materials
ISBN: 1439848580 ISBN-13(EAN): 9781439848586
Издательство: Taylor&Francis
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Цена: 188850.00 T
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Автор: Maliva
Название: Aquifer Characterization Techniques
ISBN: 3319321366 ISBN-13(EAN): 9783319321363
Издательство: Springer
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Цена: 149060.00 T
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Описание: This book presents an overview of techniques that are available to characterize sedimentary aquifers. Groundwater flow and solute transport are strongly affected by aquifer heterogeneity. Improved aquifer characterization can allow for a better conceptual understanding of aquifer systems, which can lead to more accurate groundwater models and successful water management solutions, such as contaminant remediation and managed aquifer recharge systems. This book has an applied perspective in that it considers the practicality of techniques for actual groundwater management and development projects in terms of costs, technical resources and expertise required, and investigation time. A discussion of the geological causes, types, and scales of aquifer heterogeneity is first provided. Aquifer characterization methods are then discussed, followed by chapters on data upscaling, groundwater modelling, and geostatistics. This book is a must for every practitioner, graduate student, or researcher dealing with aquifer characterization .

Автор: Maliva Robert G.
Название: Aquifer Characterization Techniques: Schlumberger Methods in Water Resources Evaluation Series No. 4
ISBN: 3319812068 ISBN-13(EAN): 9783319812069
Издательство: Springer
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Цена: 111790.00 T
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Описание: Improved aquifer characterization can allow for a better conceptual understanding of aquifer systems, which can lead to more accurate groundwater models and successful water management solutions, such as contaminant remediation and managed aquifer recharge systems.

Автор: Nedelcu
Название: Thin Films
ISBN: 3031066154 ISBN-13(EAN): 9783031066153
Издательство: Springer
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Цена: 158380.00 T
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Описание: The book provides research scientists and engineers in industry information and data on the materials processing, characterization, and determination of materials’ physical-chemical properties. The book highlights optical and chemical properties obtained on novel materials using a range of deposition methods by two different spectroscopic techniques: SE and UV-VIS-NIR. Emphasizing applications from across a number of domains including Healthcare, Opto-Electronic, and Defense, the book is ideal for academic researchers, graduate/undergraduate students, and practicing engineers concerned with optical coating technologies.

Автор: Hatsuo Ishida; Ganesh Kumar
Название: Molecular Characterization of Composite Interfaces
ISBN: 1489922539 ISBN-13(EAN): 9781489922533
Издательство: Springer
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Цена: 174150.00 T
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Описание: This book is an extended version of the proceedings of the Symposium on Polymer Composites, Interfaces, which was held under the auspices of the Division of Polymer Chemistry, American Chemical Society (ACS) during the annual ACS meeting in Seattle, March, 1983.

Автор: Dhawan, Vikas ; Babbar, Atul ; Singh, Inderdeep ;
Название: Fabrication Techniques and Machining Methods of Advanced Composite Materials
ISBN: 1032539089 ISBN-13(EAN): 9781032539089
Издательство: Taylor&Francis
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Цена: 117390.00 T
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Автор: Tompkins Harland G.
Название: Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization
ISBN: 1606507273 ISBN-13(EAN): 9781606507278
Издательство: Mare Nostrum (Eurospan)
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Цена: 66840.00 T
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Описание: Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices, flat panel and mobile displays, optical coating stacks, biological and medical coatings, protective layers, and more. While several scholarly books exist on the topic, this book provides a good introduction to the basic theory of the technique and its common applications. The target audience is not the ellipsometry scholar, but process engineers and students of materials science who are experts in their own fields and wish to use ellipsometry to measure thin film properties without becoming an expert in ellipsometry itself.