Handbook of Optical Dimensional Metrology, Harding, Kevin

Название: Handbook of Optical Metrology
ISBN: 1138112089 ISBN-13(EAN): 9781138112087
Издательство: Taylor&Francis
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Цена: 83690.00 T
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Описание:

The field of optical metrology offers a wealth of both practical and theoretical accomplishments, and can cite any number of academic papers recording such. However, while several books covering specific areas of optical metrology do exist, until the pages herein were researched, written, and compiled, the field lacked for a comprehensive handbook, one providing an overview of optical metrology that covers practical applications as well as fundamentals.

Автор: Richard Leach
Название: Advances in Optical Form and Coordinate Metrology
ISBN: 0750325224 ISBN-13(EAN): 9780750325226
Издательство: INGRAM PUBLISHER SERVICES UK
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Цена: 168960.00 T
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Описание: Many recent studies argue that domestic factors such as corruption, nepotism, and Confucian traditions of government and society prevented the industrial enterprises initiated by China from 1870 to 1911 from achieving success. Dr. Thomas takes a different view, showing that foreign intervention had more influence than purely domestic concerns on the nation`s industrialization efforts.

Автор: Harding, Kevin
Название: Handbook of Optical Dimensional Metrology
ISBN: 1439854815 ISBN-13(EAN): 9781439854815
Издательство: Taylor&Francis
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Цена: 193950.00 T
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Автор: Waldemar Nawrocki
Название: Introduction to Quantum Metrology
ISBN: 3319384791 ISBN-13(EAN): 9783319384795
Издательство: Springer
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Цена: 104480.00 T
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Описание: This book presents the theory of quantum effects used in metrology and results of the author`s own research in the field of quantum electronics.

Автор: David S. Simon; Gregg Jaeger; Alexander V. Sergien
Название: Quantum Metrology, Imaging, and Communication
ISBN: 331946549X ISBN-13(EAN): 9783319465494
Издательство: Springer
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Цена: 111790.00 T
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Описание: This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.

Автор: Wei Gao
Название: Metrology
ISBN: 9811049378 ISBN-13(EAN): 9789811049378
Издательство: Springer
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Цена: 372670.00 T
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Описание: The aim of this handbook is to provide a comprehensive summary of sensing and measurement in precision manufacturing, which is essential for process and quality control. The importance of precision sensing and measurements lies not only in the ability to distinguish whether the manufactured part meets the assigned tolerances through inspection but also, in many cases, reduce the deviation of the manufactured part from the designed values through improvement of the process or compensation manufacturing based on the sensing and measurement results. The information provided in the book will be of interest to industrial practitioners and researchers in the field of precision manufacturing sensing and measurements.

Автор: Nawrocki Waldemar
Название: Introduction to Quantum Metrology: The Revised Si System and Quantum Standards
ISBN: 3030196798 ISBN-13(EAN): 9783030196790
Издательство: Springer
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Цена: 158380.00 T
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Описание: This book discusses the theory of quantum effects used in metrology, and presents the author`s research findings in the field of quantum electronics.

Автор: Servin
Название: Fringe Pattern Analysis for Optical Metrology - Theory, Algorithms, and Applications
ISBN: 3527411526 ISBN-13(EAN): 9783527411528
Издательство: Wiley
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Цена: 125610.00 T
Наличие на складе: Нет в наличии.
Описание: The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology.

Автор: Yoshizawa, Toru
Название: Handbook of Optical Metrology
ISBN: 1466573597 ISBN-13(EAN): 9781466573598
Издательство: Taylor&Francis
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Цена: 255200.00 T
Наличие на складе: Нет в наличии.

Автор: Graham T. Smith
Название: Industrial Metrology
ISBN: 1849968780 ISBN-13(EAN): 9781849968782
Издательство: Springer
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Цена: 191550.00 T
Наличие на складе: Нет в наличии.
Описание: The subject of this book is surface metrology, in particular two major aspects: surface texture and roundness. Traditionally surface metrology usage has been dictated by engineers who have served long and demanding apprenticeships, usually in parallel with studies leading to technician-level qualifications.

Автор: Michael Quinten
Название: A Practical Guide to Surface Metrology
ISBN: 3030294536 ISBN-13(EAN): 9783030294533
Издательство: Springer
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Цена: 93160.00 T
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Описание: This book offers a genuinely practical introduction to the most commonly encountered optical and non-optical systems used for the metrology and characterization of surfaces, including guidance on best practice, calibration, advantages and disadvantages, and interpretation of results. It enables the user to select the best approach in a given context.Most methods in surface metrology are based upon the interaction of light or electromagnetic radiation (UV, NIR, IR), and different optical effects are utilized to get a certain optical response from the surface; some of them record only the intensity reflected or scattered by the surface, others use interference of EM waves to obtain a characteristic response from the surface. The book covers techniques ranging from microscopy (including confocal, SNOM and digital holographic microscopy) through interferometry (including white light, multi-wavelength, grazing incidence and shearing) to spectral reflectometry and ellipsometry. The non-optical methods comprise tactile methods (stylus tip, AFM) as well as capacitive and inductive methods (capacitive sensors, eddy current sensors).The book provides:Overview of the working principlesDescription of advantages and disadvantagesCurrently achievable numbers for resolutions, repeatability, and reproducibilityExamples of real-world applicationsA final chapter discusses examples where the combination of different surface metrology techniques in a multi-sensor system can reasonably contribute to a better understanding of surface properties as well as a faster characterization of surfaces in industrial applications. The book is aimed at scientists and engineers who use such methods for the measurement and characterization ofsurfaces across a wide range of fields and industries, including electronics, energy, automotive and medical engineering.

Автор: Simon David S., Jaeger Gregg, Sergienko Alexander V.
Название: Quantum Metrology, Imaging, and Communication
ISBN: 3319835408 ISBN-13(EAN): 9783319835402
Издательство: Springer
Рейтинг:
Цена: 139750.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.