Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques, Huhn Sebastian, Drechsler Rolf

Автор: Huhn Sebastian, Drechsler Rolf
Название: Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques
ISBN: 3030692086 ISBN-13(EAN): 9783030692087
Издательство: Springer
Цена: 102480.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications.

Автор: Jose Luis Huertas D?az
Название: Test and Design-for-Testability in Mixed-Signal Integrated Circuits
ISBN: 1441954228 ISBN-13(EAN): 9781441954220
Издательство: Springer
Рейтинг:
Цена: 144410.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods.

Автор: Tripathi Suman Lata, Saxena Sobhit, Mohapatra Sushanta Kumar
Название: Advanced VLSI Design and Testability Issues
ISBN: 0367538369 ISBN-13(EAN): 9780367538361
Издательство: Taylor&Francis
Рейтинг:
Цена: 43890.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book provides in-depth knowledge of VLSI and also the broad aspects of it by explaining its applications in different fields e.g. image processing and biomedical. The role of fault simulation algorithms is very well explained and its implementation using Verilog is the key aspect of this book.

Автор: Hu Kai, Chakrabarty Krishnendu, Ho Tsung-Yi
Название: Computer-Aided Design of Microfluidic Very Large Scale Integration (Mvlsi) Biochips: Design Automation, Testing, and Design-For-Testability
ISBN: 331985867X ISBN-13(EAN): 9783319858678
Издательство: Springer
Рейтинг:
Цена: 93160.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The technical contributions presented in this book will not only shorten the product development cycle, but also accelerate the adoption and further development of modern flow-based microfluidic biochips, by facilitating the full exploitation of design complexities that are possible with current fabrication techniques.

Автор: Bhunia Swarup, Ray Sandip, Sur-Kolay Susmita
Название: Fundamentals of IP and Soc Security: Design, Verification, and Debug
ISBN: 3319843087 ISBN-13(EAN): 9783319843087
Издательство: Springer
Рейтинг:
Цена: 83850.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book is about security in embedded systems and it provides an authoritative reference to all aspects of security in system-on-chip (SoC) designs.

Название: Advanced VLSI Design and Testability Issues
ISBN: 0367492822 ISBN-13(EAN): 9780367492823
Издательство: Taylor&Francis
Рейтинг:
Цена: 107190.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book provides in-depth knowledge of VLSI and also the broad aspects of it by explaining its applications in different fields e.g. image processing and biomedical. The role of fault simulation algorithms is very well explained and its implementation using Verilog is the key aspect of this book.

Автор: Shi-Yu Huang; Kwang-Ting (Tim) Cheng
Название: Formal Equivalence Checking and Design Debugging
ISBN: 1461376068 ISBN-13(EAN): 9781461376064
Издательство: Springer
Рейтинг:
Цена: 167700.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Formal Equivalence Checking and Design Debugging covers two major topics in design verification: logic equivalence checking and design debugging.