Контакты/Проезд  Доставка и Оплата Помощь/Возврат
История
  +7 707 857-29-98
  +7(7172) 65-23-70
  10:00-18:00 пн-пт
  shop@logobook.kz
   
    Поиск книг                        
Найти
  Зарубежные издательства Российские издательства  
Авторы | Каталог книг | Издательства | Новинки | Учебная литература | Акции | Бестселлеры | |
 

The Beginnings of Electron Microscopy - Part 2: Volume 221, Hawkes Peter W., Hytch Martin


Варианты приобретения
Цена: 189770.00T
Кол-во:
Наличие: Поставка под заказ.  Есть в наличии на складе поставщика.
Склад Америка: 188 шт.  
При оформлении заказа до: 2025-07-28
Ориентировочная дата поставки: Август-начало Сентября
При условии наличия книги у поставщика.

Добавить в корзину
в Мои желания

Автор: Hawkes Peter W., Hytch Martin
Название:  The Beginnings of Electron Microscopy - Part 2: Volume 221
ISBN: 9780323989190
Издательство: Elsevier Science
Классификация:



ISBN-10: 0323989195
Обложка/Формат: Hardcover
Страницы: 544
Вес: 0.89 кг.
Дата издания: 29.04.2022
Серия: Advances in imaging and electron physics
Язык: English
Размер: 22.86 x 15.24 x 3.02 cm
Ссылка на Издательство: Link
Рейтинг:
Поставляется из: Европейский союз
Описание: The Beginnings of Electron Microscopy - Part 2, Volume 221 in the Advances in Imaging and Electron Physics series, highlights new advances in the field, with this new volume presenting interesting chapters on Recollections from the Early Years: Canada-USA, My Recollection of the Early History of Our Work on Electron Optics and the Electron Microscope, Walter Hoppe (1917-1986), Reminiscences of the Development of Electron Optics and Electron Microscope Instrumentation in Japan, Early Electron Microscopy in The Netherlands, L. L. Marton, 1901-1979, The Invention of the Electron Fresnel Interference Biprism, The Development of the Scanning Electron Microscope, and much more.

4d electron microscopy

Автор: Zewail, Ahmed H. Thomas, John M.
Название: 4d electron microscopy
ISBN: 1848163908 ISBN-13(EAN): 9781848163904
Издательство: World Scientific Publishing
Рейтинг:
Цена: 85010.00 T
Наличие на складе: Есть
Описание: The modern electron microscope yields a wealth of quantitative knowledge pertaining to structure, dynamics, and function barely matched by any other single scientific instrument. This book compares the merits of coherent electron waves with those of synchrotron radiation.

Strain and Dislocation Gradients from Diffraction: Spatially-Resolved Local Structure and Defects

Автор: Barabash Rozaliya, Ice Gene
Название: Strain and Dislocation Gradients from Diffraction: Spatially-Resolved Local Structure and Defects
ISBN: 1908979623 ISBN-13(EAN): 9781908979629
Издательство: World Scientific Publishing
Рейтинг:
Цена: 158400.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals.Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating.

Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

Автор: Patrick Echlin
Название: Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
ISBN: 0387857303 ISBN-13(EAN): 9780387857305
Издательство: Springer
Рейтинг:
Цена: 97820.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.

Practical Electron Microscopy Of Lattice Defects

Автор: Hiroyasu Saka
Название: Practical Electron Microscopy Of Lattice Defects
ISBN: 9811234698 ISBN-13(EAN): 9789811234699
Издательство: World Scientific Publishing
Рейтинг:
Цена: 105600.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: 'Although the study of such defects is regularly examined at length in more general books on electron microscopy, this text in which they are centre-stage will surely be appreciated.' [Read Full Review]

Ultramicroscopy
This unique reference text provides those who are studying crystal lattice defects using a transmission electron microscope (TEM) with a basic knowledge of transmission electron microscopy. As it has been written for beginners, the principles of both transmission electron microscopy and crystallography have been clearly and simply explained, with the use of many figures and photographs to aid understanding. Mathematics is avoided where possible, and problems and exercises are amply provided.
Handbook of Transmission Electron Microscopy

Автор: Page Lisa
Название: Handbook of Transmission Electron Microscopy
ISBN: 1632382830 ISBN-13(EAN): 9781632382832
Издательство: Неизвестно
Цена: 190040.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.

New Horizons of Applied Scanning Electron Microscopy

Автор: Kenichi Shimizu; Tomoaki Mitani
Название: New Horizons of Applied Scanning Electron Microscopy
ISBN: 3642031595 ISBN-13(EAN): 9783642031595
Издательство: Springer
Рейтинг:
Цена: 130610.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: In modern scanning electron microscopy, sample surface preparation is of key importance. This book presents the procedures for sample surface preparation, thereby facilitating unprecedented capabilities with advanced scanning electron microscopes.

Electron Microscopy of Polymers

Автор: Michler G.H.
Название: Electron Microscopy of Polymers
ISBN: 3540363505 ISBN-13(EAN): 9783540363507
Издательство: Springer
Рейтинг:
Цена: 130610.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: There are many books on electron microscopy, however, the study of polymers by EM needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy (AFM), are given. Application of these techniques to study morphology and also properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.

Advanced Transmission Electron Microscopy

Автор: Francis Leonard Deepak; Alvaro Mayoral; Raul Arena
Название: Advanced Transmission Electron Microscopy
ISBN: 3319151762 ISBN-13(EAN): 9783319151762
Издательство: Springer
Рейтинг:
Цена: 121890.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book highlights the current understanding of materials in the context of new and continuously emerging techniques in the field of electron microscopy. The authors present applications of electron microscopic techniques in characterizing various well-known & new nanomaterials.

High-Resolution Electron Microscopy for Materials Science

Автор: Daisuke Shindo; Hiraga Kenji
Название: High-Resolution Electron Microscopy for Materials Science
ISBN: 4431702342 ISBN-13(EAN): 9784431702344
Издательство: Springer
Рейтинг:
Цена: 87070.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials.

Electron Microscopy

Автор: Kuo John
Название: Electron Microscopy
ISBN: 1627037756 ISBN-13(EAN): 9781627037754
Издательство: Springer
Рейтинг:
Цена: 232910.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:

1. Conventional Specimen Preparation Techniques For Transmission Electron Microscopy of Cultured Cells

John J. Bozzola

2. Microwave-assisted Processing and Embedding for Transmission Electron Microscopy

Paul Webster

3. Processing Plant Tissues for Ultrastructural Study John Kuo

4. Staining Sectioned Biological Specimens for Transmission Electron Microscopy:

Conventional and En Bloc Stains

E. Ann Ellis

5. Metal Shadowing for Electron Microscopy

Gregory M. Hendricks

6. Freeze Fracture and Freeze Etching

Douglas E. Chandler and William P. Sharp

7. Conventional Specimen Preparation Techniques For Scanning Electron Microscopy of Biological Specimens

John J. Bozzola

8. High-pressure Freezing: Current State and Future Prospects

Andres Kaech and Urs Ziegler

9. Cryo-fixation by Self-pressurized Rapid Freezing

Markus Grabenbauer, Hong-Mei Han, and Jan Huebinger

10. Cryo-Electron Microscopy of Vitreous Sections

Petr Chlanda and Martin Sachse

11. Negative Staining and Cryo-negative Staining: Applications in Biology and Medicine

J. Robin Harris

12. Electron Microscopy of the Microtubule Cytoskeleton Assembly Vitro

Margaret Coughlin, Aaron C. Groen, Timothy J. Mitchison

13. Cryosectioning Fixed and Cryoprotected Biological Material for Immmunocytochemistry

Paul Webster and Alexandre Webster

14. Analysis of Specificity in Immunoelectron Microscopy

Christian Hacker and John M. Lucocq

15. Cryo-Electron Microscopy of Membrane Proteins

Kenneth N. Goldie, Priyanka Abeyrathne, Fabian Kebbel, Mohamed Chami, Philippe Ringler, and Henning Stahlberg

16. Tracking DNA and RNA Sequences at High Resolution

Dusan Cmarko, Anna Ligasovб, and Karel Koberna

17. Visualization of DNA and Protein-DNA Complexes with Atomic Force Microscopy

Yuri L. Lyubchenko, Alexander A. Gall, and Luda S. Shlyakhtenko

18. Biological Applications of Phase-Contrast Electron Microscopy

Kuniaki Nagayama

19. Single Particle Cryo-Electron Microscopy And 3-D Reconstruction Of Viruses

Fei Guo and Wen Jiang

20. Electron Tomography for Organelles, Cells and Tissues

Wanzhong He and Yongning He

21. Correlative Light and Electron Microscopy: from Live Cell Dynamic to 3D Ultrastructure

Coralie Spiegelhalter, Jocelyn F. Laporte, and Yannick Schwab

22. Nanometer-resolution Fluorescence Electron Microscopy (Nano-EM) in Cultured Cells

Shigeki Watanabe, Martin Lehmann, Edward Hujber, Richard D. Fetter, Jackson Richards, Berit Sцhl-Kielczynski, Annegret Felies, Christian Rosenmund, Jan Schmoranzer, and Erik M. Jorgensen

23. Correlative Fluorescence- and Electron Microscopy of Quantum Dot Labeled Proteins on Whole Cells in Liquid

Diana B. Peckys, Madeline J. Dukes, and Niels de Jonge

24. FIB-SEM Tomography in Biology

Caroline Kizilyaprak

25. Correlative Light and Electron Microscopy using Immunolabeled Sections

Heinz Schwarz and Bruno M. Humbel

26. Correlative 3D Imaging: CLSM and FIB-SEM Tomography Using High-Pressure Frozen, Freeze-Substituted Biological Samples

Miriam S. Lucas, Maja Guenthert, Philippe Gasser, Falk Lucas and Roger Wepf

27. Three-dimensional Imaging of Adherent Cells using FIB-SEM and STEM

Clarissa Villinger, Martin Schauflinger, Heiko Gregorius, Christine Kranz, Katharina Hцhn, Soufi Nafeey, Paul Walther

28. X-Ray Microanalysis in the Scanning Electron Microscope

Godfried M. Roomans and Anca Dragomir

29. Application of SEM and EDX in Studying Biomineralization in Plant Tissues

Honghua He

30. Freeze Stabilization and Cryopreparation Technique for Visualizing the Water Distribution in Woody Tissues by X-ray Im

A Manual of Applied Techniques for Biological Electron Microscopy

Автор: Michael J. Dykstra
Название: A Manual of Applied Techniques for Biological Electron Microscopy
ISBN: 0306444496 ISBN-13(EAN): 9780306444494
Издательство: Springer
Рейтинг:
Цена: 130610.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This easy-to-follow manual describes tested procedures used to prepare biological samples for scanning and transmission electron microscopy, as well as methods for cytochemistry, immunocytochemistry, and scientific photography.

Biological Electron Microscopy

Автор: Michael J. Dykstra; Laura E. Reuss
Название: Biological Electron Microscopy
ISBN: 0306477491 ISBN-13(EAN): 9780306477492
Издательство: Springer
Рейтинг:
Цена: 111790.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Designed for an introductory one-semester course in biological electron microscopy. This work provides an introduction to the major technical approaches for sample preparation and instrumentation utilization to answer cytological questions. It covers conventional light microscopy, cryotechniques, fixation protocols, cytochemistry, and more.


Казахстан, 010000 г. Астана, проспект Туран 43/5, НП2 (офис 2)
ТОО "Логобук" Тел:+7 707 857-29-98 ,+7(7172) 65-23-70 www.logobook.kz
Kaspi QR
   В Контакте     В Контакте Мед  Мобильная версия