Advances in Metrology and Measurement of Engineering Surfaces: Select Proceedings of Icfmmp 2019, Prakash Chander, Krolczyk Grzegorz, Singh Sunpreet
Автор: Raghavendra, N V; Krishnamurthy, L Название: Engineering Metrology and Measurements ISBN: 0198085494 ISBN-13(EAN): 9780198085492 Издательство: Oxford Academ Цена: 31670.00 T Наличие на складе: Поставка под заказ. Описание: Engineering Metrology and Measurements is a textbook designed for students of mechanical, production and allied disciplines to facilitate learning of various shop-floor measurement techniques and also understand the basics of mechanical measurements.
Автор: Krolczyk Grzegorz, Prakash Chander, Singh Sunpreet Название: Advances in Intelligent Manufacturing: Select Proceedings of Icfmmp 2019 ISBN: 9811545677 ISBN-13(EAN): 9789811545672 Издательство: Springer Цена: 204970.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book consists of select proceedings of the International Conference on Functional Material, Manufacturing and Performances (ICFMMP) 2019, and presents latest research on using the combined intelligence of people, processes, and machines to impact the overall economics of manufacturing.
Автор: Richard Leach Название: Advances in Optical Form and Coordinate Metrology ISBN: 0750325224 ISBN-13(EAN): 9780750325226 Издательство: INGRAM PUBLISHER SERVICES UK Рейтинг: Цена: 168960.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Many recent studies argue that domestic factors such as corruption, nepotism, and Confucian traditions of government and society prevented the industrial enterprises initiated by China from 1870 to 1911 from achieving success. Dr. Thomas takes a different view, showing that foreign intervention had more influence than purely domestic concerns on the nation`s industrialization efforts.
Автор: Hockett, Paul Название: Quantum metrology with photoelectrons, volume ii: applications and advances ISBN: 1643270001 ISBN-13(EAN): 9781643270005 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 76690.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging applications.Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on ""complete"" photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.
Автор: Hockett, Paul Название: Quantum metrology with photoelectrons, volume ii: applications and advances ISBN: 1681746891 ISBN-13(EAN): 9781681746890 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 56370.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging applications.Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on ""complete"" photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.
Автор: Hockett, Paul Название: Quantum metrology with photoelectrons, volume i: foundations ISBN: 1681749998 ISBN-13(EAN): 9781681749990 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 92400.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 1: Foundations discusses the fundamental concepts along with recent and emerging applications.The core physics is that of photoionization, and Volume 1 addresses this topic. The foundational material is presented in part as a tutorial with extensive numerical examples and also in part as a collected reference to the relevant theoretical treatments from the literature for a range of cases. Topics are discussed with an eye to developing general quantum metrology schemes, in which full quantum state reconstruction of the photoelectron wavefunction is the goal. In many cases, code and/or additional resources are available online. Consequently, it is hoped that readers at all levels will find something of interest and that the material provides something rather different from existing textbooks.
Автор: Hockett, Paul Название: Quantum metrology with photoelectrons, volume i: foundations ISBN: 1681746859 ISBN-13(EAN): 9781681746852 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 72070.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 1: Foundations discusses the fundamental concepts along with recent and emerging applications.The core physics is that of photoionization, and Volume 1 addresses this topic. The foundational material is presented in part as a tutorial with extensive numerical examples and also in part as a collected reference to the relevant theoretical treatments from the literature for a range of cases. Topics are discussed with an eye to developing general quantum metrology schemes, in which full quantum state reconstruction of the photoelectron wavefunction is the goal. In many cases, code and/or additional resources are available online. Consequently, it is hoped that readers at all levels will find something of interest and that the material provides something rather different from existing textbooks.
This book offers an in-depth discussion related to metrological aspects of automated tests. The accuracy of experimental estimates of test object performance is examined from the standpoint of their statistical variance and systematic biases.
The proposed metrological model of automated tests allows to determine the metrological characteristics of measurement means using data from their static and dynamic calibrations. Knowledge of these characteristics provides an ability to examine their impact on the accuracy of test results for the purposes of estimating statistical uncertainties caused by instrumentation errors and eliminating biases that occur as a consequence of inertial properties of measurement means.
Optimization of requirements for measurement errors to ensure a given accuracy of test results is discussed as well.
Proposed approaches and described methods are illustrated by test examples of turbomachinery products.
Автор: Chander Prakash; Sunpreet Singh Название: Characterization, Testing, Measurement, and Metrology ISBN: 0367275155 ISBN-13(EAN): 9780367275150 Издательство: Taylor&Francis Рейтинг: Цена: 188850.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: As the field of materials and manufacturing has progressed tremendously, there is a need for up-to-date knowledge with respect to the latest novelties, techniques and applications.
Автор: French College Название: Metrology in Industry: The Key for Quality ISBN: 1905209517 ISBN-13(EAN): 9781905209514 Издательство: Wiley Рейтинг: Цена: 146730.00 T Наличие на складе: Поставка под заказ. Описание: Metrology is an integral part of the structure of today`s world: navigation and telecommunications require highly accurate time and frequency standards; human health and safety relies on authoritative measurements in diagnosis and treatment, as does food production and trade; global climate studies also depend on reliable and consistent data.
Автор: Prakash Chander, Krolczyk Grzegorz, Singh Sunpreet Название: Advances in Metrology and Measurement of Engineering Surfaces: Select Proceedings of Icfmmp 2019 ISBN: 9811551502 ISBN-13(EAN): 9789811551505 Издательство: Springer Рейтинг: Цена: 186330.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book presents the select proceedings of the International Conference on Functional Material, Manufacturing and Performances (ICFMMP) 2019.
Автор: Singh Sunpreet, Prakash Chander, Ramakrishna Seeram Название: Advances in Materials Processing: Select Proceedings of Icfmmp 2019 ISBN: 9811547505 ISBN-13(EAN): 9789811547508 Издательство: Springer Цена: 139750.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book presents the select proceedings of the International Conference on Functional Material, Manufacturing and Performances (ICFMMP) 2019.
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