Advances in Metrology and Measurement of Engineering Surfaces: Select Proceedings of Icfmmp 2019, Prakash Chander, Krolczyk Grzegorz, Singh Sunpreet

Автор: Prakash Chander, Krolczyk Grzegorz, Singh Sunpreet
Название: Advances in Metrology and Measurement of Engineering Surfaces: Select Proceedings of Icfmmp 2019
ISBN: 9811551502 ISBN-13(EAN): 9789811551505
Издательство: Springer
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Цена: 186330.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book presents the select proceedings of the International Conference on Functional Material, Manufacturing and Performances (ICFMMP) 2019.

Автор: Singh Sunpreet, Prakash Chander, Ramakrishna Seeram
Название: Advances in Materials Processing: Select Proceedings of Icfmmp 2019
ISBN: 9811547505 ISBN-13(EAN): 9789811547508
Издательство: Springer
Цена: 139750.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book presents the select proceedings of the International Conference on Functional Material, Manufacturing and Performances (ICFMMP) 2019.

Автор: Krolczyk Grzegorz, Prakash Chander, Singh Sunpreet
Название: Advances in Intelligent Manufacturing: Select Proceedings of Icfmmp 2019
ISBN: 9811545677 ISBN-13(EAN): 9789811545672
Издательство: Springer
Цена: 204970.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book consists of select proceedings of the International Conference on Functional Material, Manufacturing and Performances (ICFMMP) 2019, and presents latest research on using the combined intelligence of people, processes, and machines to impact the overall economics of manufacturing.

Автор: Prakash Chander, Singh Sunpret, Krolczyk Grzegorz
Название: Advances in Materials Science and Engineering: Select Proceedings of Icfmmp 2019
ISBN: 9811540586 ISBN-13(EAN): 9789811540585
Издательство: Springer
Рейтинг:
Цена: 186330.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book presents the select proceedings of the International Conference on Functional Material, Manufacturing and Performances (ICFMMP) 2019.

Автор: Prakash Chander, Singh Sunpret, Krolczyk Grzegorz
Название: Advances in Materials Science and Engineering: Select Proceedings of Icfmmp 2019
ISBN: 9811540616 ISBN-13(EAN): 9789811540615
Издательство: Springer
Цена: 186330.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book presents the select proceedings of the International Conference on Functional Material, Manufacturing and Performances (ICFMMP) 2019.

Автор: Singh Sunpreet, Prakash Chander, Ramakrishna Seeram
Название: Advances in Materials Processing: Select Proceedings of Icfmmp 2019
ISBN: 9811547475 ISBN-13(EAN): 9789811547478
Издательство: Springer
Рейтинг:
Цена: 139750.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book presents the select proceedings of the International Conference on Functional Material, Manufacturing and Performances (ICFMMP) 2019.

Автор: Krolczyk Grzegorz, Prakash Chander, Singh Sunpreet
Название: Advances in Intelligent Manufacturing: Select Proceedings of Icfmmp 2019
ISBN: 9811545642 ISBN-13(EAN): 9789811545641
Издательство: Springer
Рейтинг:
Цена: 204970.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book consists of select proceedings of the International Conference on Functional Material, Manufacturing and Performances (ICFMMP) 2019, and presents latest research on using the combined intelligence of people, processes, and machines to impact the overall economics of manufacturing.

Автор: Chander Prakash; Sunpreet Singh
Название: Characterization, Testing, Measurement, and Metrology
ISBN: 0367275155 ISBN-13(EAN): 9780367275150
Издательство: Taylor&Francis
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Цена: 188850.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: As the field of materials and manufacturing has progressed tremendously, there is a need for up-to-date knowledge with respect to the latest novelties, techniques and applications.

Автор: Raghavendra, N V; Krishnamurthy, L
Название: Engineering Metrology and Measurements
ISBN: 0198085494 ISBN-13(EAN): 9780198085492
Издательство: Oxford Academ
Цена: 31670.00 T
Наличие на складе: Нет в наличии.
Описание: Engineering Metrology and Measurements is a textbook designed for students of mechanical, production and allied disciplines to facilitate learning of various shop-floor measurement techniques and also understand the basics of mechanical measurements.

Автор: French College
Название: Metrology in Industry: The Key for Quality
ISBN: 1905209517 ISBN-13(EAN): 9781905209514
Издательство: Wiley
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Цена: 146730.00 T
Наличие на складе: Поставка под заказ.
Описание: Metrology is an integral part of the structure of today`s world: navigation and telecommunications require highly accurate time and frequency standards; human health and safety relies on authoritative measurements in diagnosis and treatment, as does food production and trade; global climate studies also depend on reliable and consistent data.

Автор: Richard Leach
Название: Advances in Optical Form and Coordinate Metrology
ISBN: 0750325224 ISBN-13(EAN): 9780750325226
Издательство: INGRAM PUBLISHER SERVICES UK
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Цена: 168960.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Many recent studies argue that domestic factors such as corruption, nepotism, and Confucian traditions of government and society prevented the industrial enterprises initiated by China from 1870 to 1911 from achieving success. Dr. Thomas takes a different view, showing that foreign intervention had more influence than purely domestic concerns on the nation`s industrialization efforts.

Автор: Hockett, Paul
Название: Quantum metrology with photoelectrons, volume ii: applications and advances
ISBN: 1643270001 ISBN-13(EAN): 9781643270005
Издательство: Mare Nostrum (Eurospan)
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Цена: 76690.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging applications.Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on ""complete"" photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.