High Definition Metrology Based Surface Quality Control and Applications, Du Shichang, XI Lifeng
Автор: Raghavendra, N V; Krishnamurthy, L Название: Engineering Metrology and Measurements ISBN: 0198085494 ISBN-13(EAN): 9780198085492 Издательство: Oxford Academ Цена: 31670.00 T Наличие на складе: Поставка под заказ. Описание: Engineering Metrology and Measurements is a textbook designed for students of mechanical, production and allied disciplines to facilitate learning of various shop-floor measurement techniques and also understand the basics of mechanical measurements.
Автор: Shichang Du; Lifeng Xi Название: High Definition Metrology Based Surface Quality Control and Applications ISBN: 9811502781 ISBN-13(EAN): 9789811502781 Издательство: Springer Рейтинг: Цена: 93160.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book provides insights into surface quality control techniques and applications based on high-definition metrology (HDM). Intended as a reference resource for engineers who routinely use a variety of quality control methods and are interested in understanding the data processing, from HDM data to final control actions, it can also be used as a textbook for advanced courses in engineering quality control applications for students who are already familiar with quality control methods and practices. It enables readers to not only assimilate the quality control methods involved, but also to quickly implement the techniques in practical engineering problems. Further, it includes numerous case studies to highlight the implementation of the methods using measured HDM data of surface features. Since MATLAB is extensively employed in these case studies, familiarity with this software is helpful, as is a general understanding of surface quality control methods.
Автор: French College Название: Metrology in Industry: The Key for Quality ISBN: 1905209517 ISBN-13(EAN): 9781905209514 Издательство: Wiley Рейтинг: Цена: 146730.00 T Наличие на складе: Поставка под заказ. Описание: Metrology is an integral part of the structure of today`s world: navigation and telecommunications require highly accurate time and frequency standards; human health and safety relies on authoritative measurements in diagnosis and treatment, as does food production and trade; global climate studies also depend on reliable and consistent data.
Автор: Jones Bruce Название: Formula One Circuits from Above: 28 Legendary Tracks in High-Definition Satellite Photography ISBN: 1780979835 ISBN-13(EAN): 9781780979830 Издательство: Carlton Books Рейтинг: Цена: 26400.00 T Наличие на складе: Поставка под заказ. Описание: Formula One fans will enjoy exploring the sport in a unique way: using the breathtaking satellite photography of Google Earth This revised edition of Formula One Circuits from Above contains entirely new entries on tracks in Baku, Azerbaijan and Sochi, Russia, along with image and text updates to many of the 28 courses. Thanks to Google's extraordinary mapping technology, everything on these 28 tracks is sharp and clear--all the corners, chicanes, and curves, where the most spectacular action happens. While you'll likely never drive the courses in Melbourne or Singapore, with Google's detailed notes on gears and speeds, and Formula One authority Bruce Jones's insights on the races, you can experience the exhilaration vicariously.
Автор: Harman Название: Skepticism and the Definition of Knowledge ISBN: 113891018X ISBN-13(EAN): 9781138910188 Издательство: Taylor&Francis Рейтинг: Цена: 46950.00 T Наличие на складе: Нет в наличии. Описание: Originally published in 1990. This study takes us through the argument for the possibility of scepticism, including looking at sense data and considering memory and perception.
Автор: Kevin Harding, Song Zhang Название: Dimensional Optical Metrology and Inspection for Practical Applications VII ISBN: 1510618457 ISBN-13(EAN): 9781510618459 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 71150.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Автор: Sen Han, Toru Yoshizawa, Song Zhang Название: Optical Metrology and Inspection for Industrial Applications IV ISBN: 1510604650 ISBN-13(EAN): 9781510604650 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 132130.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.
Автор: Kevin Harding, Song Zhang Название: Dimensional Optical Metrology and Inspection for Practical Applications V ISBN: 1510601090 ISBN-13(EAN): 9781510601093 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 71150.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.
Автор: Bo Su, Eric Solecky, Alok Vaid Название: Introduction to Metrology Applications in IC Manufacturing ISBN: 1628418117 ISBN-13(EAN): 9781628418118 Издательство: Mare Nostrum (Eurospan) Цена: 55170.00 T Наличие на складе: Невозможна поставка. Описание: Metrology has grown significantly, especially in semiconductor manufacturing, and such growth necessitates increased expertise. Until now, this field has never had a book written from the perspective of an engineer in a modern IC manufacturing and development environment. The topics in this Tutorial Text range from metrology at its most basic level to future predictions and challenges, including measurement methods, industrial applications, fundamentals of traditional measurement system characterization and calibration, semiconductor-specific applications, optical metrology measurement techniques, charged particle measurement techniques, x-ray and in situ metrology, hybrid metrology, and mask making. The accompanying CD includes example spreadsheets of measurement uncertainty analysis—specifically, precision, matching, and relative accuracy.
Автор: Hockett, Paul Название: Quantum metrology with photoelectrons, volume ii: applications and advances ISBN: 1643270001 ISBN-13(EAN): 9781643270005 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 76690.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging applications.Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on ""complete"" photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.
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