Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization, Tan Sheldon, Tahoori Mehdi, Kim Taeyoung
Автор: J. Bhasker; Rakesh Chadha Название: Static Timing Analysis for Nanometer Designs ISBN: 1441947159 ISBN-13(EAN): 9781441947154 Издательство: Springer Рейтинг: Цена: 149060.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: iming, timing, timing! This book addresses the timing verification using static timing analysis for nanometer designs. The chip designers lack a central reference for information on timing, that covers the basics to the advanced timing veri- cation procedures and techniques.
Автор: Ashish Srivastava; Dennis Sylvester; David Blaauw Название: Statistical Analysis and Optimization for VLSI: Timing and Power ISBN: 1441938273 ISBN-13(EAN): 9781441938275 Издательство: Springer Рейтинг: Цена: 130590.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Comprises a valuable reference for statistical analysis and optimization techniques in current and future VLSI design for CAD-Tool developers and for researchers interested in starting work in this very active area of research.
Автор: Rokka Chhetri Sujit, Al Faruque Mohammad Abdullah Название: Data-Driven Modeling of Cyber-Physical Systems Using Side-Channel Analysis ISBN: 3030379612 ISBN-13(EAN): 9783030379612 Издательство: Springer Рейтинг: Цена: 74530.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book provides a new perspective on modeling cyber-physical systems (CPS), using a data-driven approach.
Автор: M.C. Bhuvaneswari Название: Application of Evolutionary Algorithms for Multi-objective Optimization in VLSI and Embedded Systems ISBN: 8132235398 ISBN-13(EAN): 9788132235392 Издательство: Springer Рейтинг: Цена: 95770.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book describes how evolutionary algorithms (EA), including genetic algorithms (GA) and particle swarm optimization (PSO) can be utilized for solving multi-objective optimization problems in the area of embedded and VLSI system design.
Автор: Sheldon Tan; Mehdi Tahoori; Taeyoung Kim; Shengche Название: Long-Term Reliability of Nanometer VLSI Systems ISBN: 3030261719 ISBN-13(EAN): 9783030261719 Издательство: Springer Рейтинг: Цена: 139750.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems, electromigrations (EM) for interconnect and biased temperature instability (BTI) for CMOS devices. The authors discuss in detail recent developments in the modeling, analysis and optimization of the reliability effects from EM and BTI induced failures at the circuit, architecture and system levels of abstraction. Readers will benefit from a focus on topics such as recently developed, physics-based EM modeling, EM modeling for multi-segment wires, new EM-aware power grid analysis, and system level EM-induced reliability optimization and management techniques.
Reviews classic Electromigration (EM) models, as well as existing EM failure models and discusses the limitations of those models;Introduces a dynamic EM model to address transient stress evolution, in which wires are stressed under time-varying current flows, and the EM recovery effects. Also includes new, parameterized equivalent DC current based EM models to address the recovery and transient effects;Presents a cross-layer approach to transistor aging modeling, analysis and mitigation, spanning multiple abstraction levels;Equips readers for EM-induced dynamic reliability management and energy or lifetime optimization techniques, for many-core dark silicon microprocessors, embedded systems, lower power many-core processors and datacenters.
Автор: Canelas Antуnio Manuel Lourenзo, Guilherme Jorge Manuel Correia, Horta Nuno Cavaco Gomes Название: Yield-Aware Analog IC Design and Optimization in Nanometer-Scale Technologies ISBN: 303041535X ISBN-13(EAN): 9783030415358 Издательство: Springer Рейтинг: Цена: 93160.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book presents a new methodology with reduced time impact to address the problem of analog integrated circuit (IC) yield estimation by means of Monte Carlo (MC) analysis, inside an optimization loop of a population-based algorithm.
Автор: Elie Maricau; Georges Gielen Название: Analog IC Reliability in Nanometer CMOS ISBN: 1489986308 ISBN-13(EAN): 9781489986306 Издательство: Springer Рейтинг: Цена: 104480.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book covers modeling, simulation and analysis of analog circuit aging, nanometer CMOS physical effects resulting in unreliability, transistor aging compact models for circuit simulation, methods for efficient circuit reliability simulation and more.
Автор: Elie Maricau; Georges Gielen Название: Analog IC Reliability in Nanometer CMOS ISBN: 1461461626 ISBN-13(EAN): 9781461461623 Издательство: Springer Рейтинг: Цена: 130430.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book covers modeling, simulation and analysis of analog circuit aging, nanometer CMOS physical effects resulting in unreliability, transistor aging compact models for circuit simulation, methods for efficient circuit reliability simulation and more.
Автор: Umit Y. Ogras; Radu Marculescu Название: Modeling, Analysis and Optimization of Network-on-Chip Communication Architectures ISBN: 9400798652 ISBN-13(EAN): 9789400798656 Издательство: Springer Рейтинг: Цена: 104480.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Presenting a mathematical model for on-chip routers which can be used for NoC performance analysis, this book reflects the shift from computation- to communication-based design that has resulted from the increasing complexity of so-called `systems-on-chip`.
Автор: Ogras Umit Название: Modeling, Analysis and Optimization of Network-on-Chip Commu ISBN: 9400739575 ISBN-13(EAN): 9789400739574 Издательство: Springer Рейтинг: Цена: 121890.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Presenting a mathematical model for on-chip routers which can be used for NoC performance analysis, this book reflects the shift from computation- to communication-based design that has resulted from the increasing complexity of so-called `systems-on-chip`.
Автор: Robin A. Sahner; Kishor Trivedi; Antonio Puliafito Название: Performance and Reliability Analysis of Computer Systems ISBN: 1461360056 ISBN-13(EAN): 9781461360056 Издательство: Springer Рейтинг: Цена: 139750.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Performance and Reliability Analysis of Computer Systems: An Example-Based Approach Using the SHARPE Software Package provides a variety of probabilistic, discrete-state models used to assess the reliability and performance of computer and communication systems.
Автор: M.C. Bhuvaneswari Название: Application of Evolutionary Algorithms for Multi-objective Optimization in VLSI and Embedded Systems ISBN: 8132219570 ISBN-13(EAN): 9788132219576 Издательство: Springer Рейтинг: Цена: 130430.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book describes how evolutionary algorithms (EA), including genetic algorithms (GA) and particle swarm optimization (PSO) can be utilized for solving multi-objective optimization problems in the area of embedded and VLSI system design.
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