Electron backscatter diffraction in materials science, 

Автор: Pecharsky, Vitalij K. Zavalij, Peter
Название: Fundamentals of powder diffraction and structural characterization of materials. 2 ed.
ISBN: 0387095780 ISBN-13(EAN): 9780387095783
Издательство: Springer
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Описание: A little over ?ve years have passed since the ?rst edition of this book appeared in print. Seems like an instant but also eternity, especially considering numerous developments in the hardware and software that have made it from the laboratory test beds into the real world of powder diffraction.

Автор: Zhili, Dong (nanyang Technological University, Singapore)
Название: Fundamentals of crystallography, powder x-ray diffraction, and transmission electron microscopy for materials scientists
ISBN: 0367357941 ISBN-13(EAN): 9780367357948
Издательство: Taylor&Francis
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Цена: 117390.00 T
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Описание: The structure–property relationship is a key topic in materials science and engineering. To understand why a material displays certain behaviors, the first step is to resolve its crystal structure and reveal its structure characteristics. Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists equips readers with an in-depth understanding of using powder x-ray diffraction and transmission electron microscopy for the analysis of crystal structures.Introduces fundamentals of crystallographyCovers XRD of materials, including geometry and intensity of diffracted x-ray beams and experimental methodsDescribes TEM of materials and includes atomic scattering factors, electron diffraction, and diffraction and phase contrastsDiscusses applications of HRTEM in materials researchExplains concepts used in XRD and TEM lab trainingBased on the author’s course lecture notes, this text guides materials science and engineering students with minimal reliance on advanced mathematics. It will also appeal to a broad spectrum of readers, including researchers and professionals working in the disciplines of materials science and engineering, applied physics, and chemical engineering.

Автор: Eric J. Mittemeijer; Paolo Scardi
Название: Diffraction Analysis of the Microstructure of Materials
ISBN: 3642073522 ISBN-13(EAN): 9783642073526
Издательство: Springer
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Цена: 217670.00 T
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Описание: Overview of diffraction methods applied to the analysis of the microstructure of materials.

Автор: Lyle H. Schwartz; Jerome B. Cohen
Название: Diffraction from Materials
ISBN: 3642829295 ISBN-13(EAN): 9783642829291
Издательство: Springer
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Цена: 93160.00 T
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Описание: With new tools such as the high-resolution electron microscope, new detectors, new techniques (such as EXAFS and glancing angle diffraction) and the new sources, the horizons of this field greatly expanded in the 1950`s and 60`s.

Автор: Lee Myeongkyu
Название: X-Ray Diffraction for Materials Research: From Fundamentals to Applications
ISBN: 1774635933 ISBN-13(EAN): 9781774635933
Издательство: Taylor&Francis
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Цена: 84710.00 T
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Описание: This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how

Название: Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials: Garmisch-Partenkirchen, October 7-9, 2007
ISBN: 3486992554 ISBN-13(EAN): 9783486992557
Издательство: Walter de Gruyter
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Цена: 195870.00 T
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Описание: Presents the complete Proceedings of all contributions to the V Size Strain Conference in Garmisch-Partenkirchen 2007: Lattice Defects Residual Stresses Texture in Thin Films and at Surfaces Line-Broadening Analysis and Line-Profile Fitting Diffraction/Microstructure Modeling.

Автор: T.A. Ezquerra; Mari Cruz Garcia-Gutierrez; Aurora
Название: Applications of Synchrotron Light to Scattering and Diffraction in Materials and Life Sciences
ISBN: 354095967X ISBN-13(EAN): 9783540959670
Издательство: Springer
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Цена: 74530.00 T
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Описание: Covers cases of relevance and interest where the combination of synchrotron light with various scattering and diffraction techniques is a very helpful approach to obtaining information about the structure of large molecular assemblies in low-ordered environments.

Автор: Michel A. VanHove; William Henry Weinberg; Chi-Min
Название: Low-Energy Electron Diffraction
ISBN: 3642827233 ISBN-13(EAN): 9783642827235
Издательство: Springer
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Описание: Surface crystallography plays the same fundamental role in surface science which bulk crystallography has played so successfully in solid-state physics and chemistry.

Автор: Liu Lai Chung
Название: Chemistry in Action: Making Molecular Movies with Ultrafast Electron Diffraction and Data Science
ISBN: 3030548503 ISBN-13(EAN): 9783030548506
Издательство: Springer
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Цена: 93160.00 T
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Описание: The author shows that there is a simple solution that occurs during barrier crossing in which the highly anharmonic potential at that point in nuclear rearrangements couples high- and low-frequency vibrational modes to give highly localized nuclear motions, reducing hundreds of potential degrees of freedom to just a few key modes.

Автор: P.K. Larsen; P.J. Dobson
Название: Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces
ISBN: 1468455826 ISBN-13(EAN): 9781468455823
Издательство: Springer
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Описание: Proceedings of a NATO ARW held in Veldhoven, The Netherlands, June 15-19, 1987