Автор: Leet, Kenneth Uang, Chia-ming Lanning, Joel Название: Ise fundamentals of structural analysis ISBN: 1260570444 ISBN-13(EAN): 9781260570441 Издательство: McGraw-Hill Цена: 67490 T Наличие на складе: Поставка под заказ. Описание: HE Engineering
Автор: Dominique Chapelle; Klaus-Jurgen Bathe Название: The Finite Element Analysis of Shells - Fundamentals ISBN: 3642266312 ISBN-13(EAN): 9783642266317 Издательство: Springer Рейтинг: Цена: 214280.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book presents a modern continuum mechanics and mathematical framework to study shell physical behaviors, and to formulate and evaluate finite element procedures.
Автор: Pecharsky, Vitalij K. Zavalij, Peter Название: Fundamentals of powder diffraction and structural characterization of materials. 2 ed. ISBN: 0387095780 ISBN-13(EAN): 9780387095783 Издательство: Springer Рейтинг: Цена: 102480.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: A little over ?ve years have passed since the ?rst edition of this book appeared in print. Seems like an instant but also eternity, especially considering numerous developments in the hardware and software that have made it from the laboratory test beds into the real world of powder diffraction.
Автор: Yunus A C?engel; John M Cimbala Название: Fluid mechanics : fundamentals and applications ISBN: 1259921905 ISBN-13(EAN): 9781259921902 Издательство: McGraw-Hill Рейтинг: Цена: 67490.00 T Наличие на складе: Невозможна поставка. Описание: Covering the basic principles and equations of fluid mechanics in the context of numerous and diverse real-world engineering examples, this text helps students develop an intuitive understanding of fluid mechanics by emphasizing the physics, using figures, numerous photographs and visual aids to reinforce the physics.
Автор: Terry L. Alford; L.C. Feldman; James W. Mayer Название: Fundamentals of Nanoscale Film Analysis ISBN: 1441939806 ISBN-13(EAN): 9781441939807 Издательство: Springer Рейтинг: Цена: 73990.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание:
Modern science and technology, from materials science to integrated circuit development, is directed toward the nanoscale. From thin films to field effect transistors, the emphasis is on reducing dimensions from the micro to the nanoscale. Fundamentals of NanoscaleFilm Analysis concentrates on analysis of the structure and composition of the surface and the outer few tens to hundred nanometers in depth. It describes characterization techniques to quantify the structure, composition and depth distribution of materials with the use of energetic particles and photons.
The book describes the fundamentals of materials characterization from the standpoint of the incident photons or particles which interrogate nanoscale structures. These induced reactions lead to the emission of a variety of detected of particles and photons. It is the energy and intensity of the detected beams that is the basis of the characterization of the materials. The array of experimental techniques used in nanoscale materials analysis covers a wide range of incident particle and detected beam interactions.
Included are such important interactions as atomic collisions, Rutherford backscattering, ion channeling, diffraction, photon absorption, radiative and nonradiative transitions, and nuclear reactions. A variety of analytical and scanning probe microscopy techniques are presented in detail.
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