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Advancing silicon carbide electronics technology ii, 


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Название:  Advancing silicon carbide electronics technology ii
ISBN: 9781644900666
Издательство: Materials research forum llc
Классификация:





ISBN-10: 1644900661
Обложка/Формат: Paperback
Страницы: 292
Вес: 0.39 кг.
Дата издания: 15.03.2020
Серия: Materials research foundations
Язык: English
Иллюстрации: Illustrations
Размер: 152 x 230 x 13
Читательская аудитория: General (us: trade)
Подзаголовок: Core technologies of silicon carbide device processing
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Поставляется из: США
Описание: The book presents an in-depth review and analysis of Silicon Carbide device processing. Keywords: Silicon Carbide, SiC, Technology, Processing, Semiconductor Devices, Material Properties, Polytypism, Thermal Oxidation, Post Oxidation Annealing, Surface Passivation, Dielectric Deposition, Field Effect Mobility, Ion Implantation, Post Implantation Annealing, Channeling, Surface Roughness, Dry Etching, Plasma Etching, Ion Etching, Sputtering, Chemical Etching, Plasma Chemistry, Micromasking, Microtrenching, Nanocrystal, Nanowire, Nanotube, Nanopillar, Nanoelectromechanical Systems (NEMS).

Silicon Carbide Diodes Characterization at High Temperature and Comparison with Silicon Devices

Название: Silicon Carbide Diodes Characterization at High Temperature and Comparison with Silicon Devices
ISBN: 1287281710 ISBN-13(EAN): 9781287281719
Издательство: Неизвестно
Цена: 18090.00 T
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Interfacial Reactions in Nickel/titanium Ohmic Contacts to N-type Silicon Carbide

Автор: Park Jae
Название: Interfacial Reactions in Nickel/titanium Ohmic Contacts to N-type Silicon Carbide
ISBN: 0530001861 ISBN-13(EAN): 9780530001869
Издательство: Неизвестно
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Цена: 80930.00 T
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Описание: Dissertation Discovery Company and University of Florida are dedicated to making scholarly works more discoverable and accessible throughout the world. This dissertation, "Interfacial reactions in nickel/titanium ohmic contacts to n-type silicon carbide" by Jae Hyun Park, was obtained from University of Florida and is being sold with permission from the author. A digital copy of this work may also be found in the university's institutional repository, IR@UF. The content of this dissertation has not been altered in any way. We have altered the formatting in order to facilitate the ease of printing and reading of the dissertation.

Interfacial Reactions in Nickel/titanium Ohmic Contacts to N-type Silicon Carbide

Автор: Park Jae
Название: Interfacial Reactions in Nickel/titanium Ohmic Contacts to N-type Silicon Carbide
ISBN: 053000187X ISBN-13(EAN): 9780530001876
Издательство: Неизвестно
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Цена: 114030.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Dissertation Discovery Company and University of Florida are dedicated to making scholarly works more discoverable and accessible throughout the world. This dissertation, "Interfacial reactions in nickel/titanium ohmic contacts to n-type silicon carbide" by Jae Hyun Park, was obtained from University of Florida and is being sold with permission from the author. A digital copy of this work may also be found in the university's institutional repository, IR@UF. The content of this dissertation has not been altered in any way. We have altered the formatting in order to facilitate the ease of printing and reading of the dissertation.

Physics and Technology of Silicon Carbide Devices

Автор: George Gibbs
Название: Physics and Technology of Silicon Carbide Devices
ISBN: 1681176432 ISBN-13(EAN): 9781681176437
Издательство: Gazelle Book Services
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Цена: 217350.00 T
Наличие на складе: Невозможна поставка.
Описание: "Silicon (Si) is by far the most widely used semiconductor material for power devices. On the other hand, Si-based power devices are approaching their material limits, which has provoked a lot of efforts to find alternatives to Si-based power devices for better performance. With the rapid innovations and developments in the semiconductor industry, Silicon Carbide (SiC) power devices have progressed from immature prototypes in laboratories to a viable alternative to Si-based power devices in high-efficiency and high-power density applications. SiC devices have numerous persuasive advantageshigh-breakdown voltage, high-operating electric field, high-operating temperature, high-switching frequency and low losses. Silicon Carbide (SiC) devices belong to the so-called wide band gap semiconductor group, which offers a number of attractive characteristics for high voltage power semiconductors when compared to commonly used silicon (Si). Recently, some SiC power devices, for example, Schottky-barrier diodes (SBDs), metal-oxide-semiconductor field-effecttransistors (MOSFETs), junction FETs (JFETs), and their integrated modules have come onto the market. Physics and Technology of Silicon Carbide Devices abundantly describes recent technologies on manufacturing, processing, characterization, modeling, etc. for SiC devices."

Silicon Carbide Devices and Technology

Автор: Fraley Bill
Название: Silicon Carbide Devices and Technology
ISBN: 1632384140 ISBN-13(EAN): 9781632384140
Издательство: Неизвестно
Цена: 171660.00 T
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Описание: This book elaborately discusses the silicon carbide devices and their technology. Lately, a few Silicon Carbide (SiC ) power devices like metal-oxide-semiconductor field-effect-transistors (MOSFETs), Schottky-barrier diodes (SBDs), junction FETs (JFETs), and their combined modules have been introduced in the market. However, to securely supply them and decrease their cost, further enhancements for material characterizations as well as for device processing are still required. This book comprehensively elucidates current technologies on processing, modeling, characterization, manufacturing, and other important aspects of SiC devices. The aim of this book is to serve as a helpful source of information for advancements in SiC devices.

Use of Quantum Mechanical Calculations to Investigate Small Silicon Carbide Clusters

Автор: Henry Jean W.
Название: Use of Quantum Mechanical Calculations to Investigate Small Silicon Carbide Clusters
ISBN: 1288306296 ISBN-13(EAN): 9781288306299
Издательство: Неизвестно
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Цена: 71050.00 T
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Three-Dimensional Positron Annihilation Momentum Measurement Technique Applied to Measure Oxygen-Atom Defects in 6h Silicon Carbide

Автор: Williams Christopher S.
Название: Three-Dimensional Positron Annihilation Momentum Measurement Technique Applied to Measure Oxygen-Atom Defects in 6h Silicon Carbide
ISBN: 1288398662 ISBN-13(EAN): 9781288398669
Издательство: Неизвестно
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Цена: 71050.00 T
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Stress Analysis of Silicon Carbide Microelectromechanical Systems Using Raman Spectroscopy

Автор: Ness Stanley J.
Название: Stress Analysis of Silicon Carbide Microelectromechanical Systems Using Raman Spectroscopy
ISBN: 128686237X ISBN-13(EAN): 9781286862377
Издательство: Неизвестно
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Цена: 71050.00 T
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Quantum Mechanical Calculations of Monoxides of Silicon Carbide Molecules

Автор: Roberts John W.
Название: Quantum Mechanical Calculations of Monoxides of Silicon Carbide Molecules
ISBN: 1286866731 ISBN-13(EAN): 9781286866733
Издательство: Неизвестно
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Цена: 71050.00 T
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Electrical Characterization of Non-Implanted 4h-Silicon Carbide

Автор: Morath Christain M.
Название: Electrical Characterization of Non-Implanted 4h-Silicon Carbide
ISBN: 1286864267 ISBN-13(EAN): 9781286864265
Издательство: Неизвестно
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Цена: 71050.00 T
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