Автор: Zewail, Ahmed H. Thomas, John M. Название: 4d electron microscopy ISBN: 1848163908 ISBN-13(EAN): 9781848163904 Издательство: World Scientific Publishing Рейтинг: Цена: 85010.00 T Наличие на складе: Есть Описание: The modern electron microscope yields a wealth of quantitative knowledge pertaining to structure, dynamics, and function barely matched by any other single scientific instrument. This book compares the merits of coherent electron waves with those of synchrotron radiation.
Автор: Daisuke Shindo; Hiraga Kenji Название: High-Resolution Electron Microscopy for Materials Science ISBN: 4431702342 ISBN-13(EAN): 9784431702344 Издательство: Springer Рейтинг: Цена: 87070.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials.
Название: Encyclopedia of Scanning Electron Microscopy ISBN: 1632381664 ISBN-13(EAN): 9781632381668 Издательство: Неизвестно Цена: 155570.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book focuses on various issues concerned with scanning electron microscopy, as well as its theoretical and practical applications. Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well instrumented and supplemented with advanced techniques and methods and thereby present endless possibilities in the areas of quantitative measurement of object topologies, surface imaging, performing elemental analysis and local electrophysical characteristics of semiconductor structures. Creation of micro and nanostructures involves extensive use of fine focused e-beam. Numerous topics are covered under two sections Instrumentation, Methodology and Biology, Medicine for electronic industry. This book includes contributions by renowned researchers and experts in this field.
Автор: Anna Rita Bizzarri, Salvatore Cannistraro Название: Dynamic Force Spectroscopy and Biomolecular Recognition ISBN: 1138374520 ISBN-13(EAN): 9781138374522 Издательство: Taylor&Francis Рейтинг: Цена: 63280.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Molecular recognition, also known as biorecognition, is the heart of all biological interactions. Originating from protein stretching experiments, dynamic force spectroscopy (DFS) allows for the extraction of detailed information on the unbinding process of biomolecular complexes. It is becoming progressively more important in biochemical studies and is finding wider applications in areas such as biophysics and polymer science. In six chapters, Dynamic Force Spectroscopy and Biomolecular Recognition covers the most recent ideas and advances in the field of DFS applied to biorecognition: Chapter 1: Reviews the basic and novel aspects of biorecognition and discusses the emerging capabilities of single-molecule techniques to disclose kinetic properties and molecular mechanisms usually hidden in bulk measurements Chapter 2: Describes the basic principle of atomic force microsocopy (AFM) and DFS, with particular attention to instrumental and theoretical aspects more strictly related to the study of biomolecules Chapter 3: Overviews the theoretical background in which experimental data taken in nonequilibrum measurements of biomolecular unbinding forces are extrapolated to equilibrium conditions Chapter 4: Reviews the most common and efficient strategies adopted in DFS experiments to immobilize the interacting biomolecules to the AFM tip and to the substrate Chapter 5: Presents and discusses the most representative aspects related to the analysis of DFS data and the challenges of integrating well-defined criteria to calibrate data in automatic routinary procedures Chapter 6: Overviews the most relevant DFS applications to study biorecognition processes, including the biotin/avidin pair, and selected results on various biological complexes, including antigen/antibody, proteins/DNA, and complexes involved in adhesion processes Chapter 7: Summarizes the main results obtained by DFS applied to study biorecognition processes with forthcoming theoretical and experimental advances Although DFS is a widespread, worldwide technique, no books focused on this subject have been available until now. Dynamic Force Spectroscopy and Biomolecular Recognition provides the state of the art of experimental data analysis and theoretical procedures, making it a useful tool for researchers applying DFS to study biorecognition processes.
Автор: Kirkland Angus I, Moldovan Grigore Название: Digital Imaging Detectors For Electron Microscopy ISBN: 1848162855 ISBN-13(EAN): 9781848162853 Издательство: World Scientific Publishing Рейтинг: Цена: 59130.00 T Наличие на складе: Поставка под заказ. Описание: Electron microscopes are used in most investigation methods in materials science and are key players in the rise of nanotechnology. This book discusses theoretical, technological and functional aspects of electron detectors. It is suitable for researchers in electron microscopy.
Автор: Morel, Gerard , Cavalier, Annie , Williams, Lynd Название: In Situ Hybridization in Electron Microscopy ISBN: 0367455374 ISBN-13(EAN): 9780367455378 Издательство: Taylor&Francis Рейтинг: Цена: 63280.00 T Наличие на складе: Нет в наличии. Описание: In situ hybridization is a technique that allows for the visualization of specific DNA and RNA sequences in individual cells, and is an especially important method for studying nucleic acids in heterogeneous cell populations. in situ Hybridization in Electron Microscopy reviews the three main methods and describes the different stages in detail: th
Автор: Randle, Valerie Название: The Measurement of Grain Boundary Geometry ISBN: 0367402351 ISBN-13(EAN): 9780367402358 Издательство: Taylor&Francis Рейтинг: Цена: 61240.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание:
As the selection of material for particular engineering properties becomes increasingly important in keeping costs down, methods for evaluating material properties also become more relevant. One such method examines the geometry of grain boundaries, which reveals much about the properties of the material.
Studying material properties from their geometrical measurements, The Measurement of Grain Boundary Geometry provides a framework for a specialized application of electron microscopy for metals and alloys and, by extension, for ceramics, minerals, and semiconductors. The book presents an overview of the developments in the theory of grain boundary geometry and its practical applications in material engineering. It also covers the tunneling electron microscope (TEM), experimental aspects of data collection, data processing, and examples from actual investigations. Each step of the analysis process is clearly described, from data collection through processing, analysis, representation, and display to applications. The book also includes a glossary of terms. Exploring both the experimental and analytical aspects of the subject, this practical reference guide is essential for researchers and students involved in material properties, whether in physics, materials science, metallurgy, or physical chemistry.
Название: Electron and Ion Microscopy and Microanalysis ISBN: 0367402947 ISBN-13(EAN): 9780367402945 Издательство: Taylor&Francis Рейтинг: Цена: 67360.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr
Автор: Hawkes, Peter W. Название: Computer Techniques For Image Processing In Electron Microscopy,214 ISBN: 0128209992 ISBN-13(EAN): 9780128209998 Издательство: Elsevier Science Рейтинг: Цена: 202120.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание:
Computer Techniques for Image Processing in Electron Microscopy, Volume 214 in the Advances in Imaging and Electron Physics series, presents the latest advances in the field, with this new volume covering Image Formation Theory, The Discrete Fourier Transform, Analytic Images, The Image and Diffraction Plane Problem: Uniqueness, The Image and Diffraction Plane Problem: Numerical Methods, The Image and Diffraction Plane Problem: Computational Trials, Alternative Data for the Phase Determination, The Hardware of Digital Image Handling, Basic Software or Digital Image Handling, Improc, and much more.
This book deals with the subject of secondary energy spectroscopy in the scanning electron microscope (SEM). The SEM is a widely used research instrument for scientific and engineering research and its low energy scattered electrons, known as secondary electrons, are used mainly for the purpose of nanoscale topographic imaging. This book demonstrates the advantages of carrying out precision electron energy spectroscopy of its secondary electrons, in addition to them being used for imaging. The book will demonstrate how secondary electron energy spectroscopy can transform the SEM into a powerful analytical tool that can map valuable material science information to the nanoscale, superimposing it onto the instrument's normal topographic mode imaging. The book demonstrates how the SEM can then be used to quantify/identify materials, acquire bulk density of states information, capture dopant density distributions in semiconductor specimens, and map surface charge distributions.
Автор: Kirkland Earl J. Название: Advanced Computing in Electron Microscopy ISBN: 3030332594 ISBN-13(EAN): 9783030332594 Издательство: Springer Рейтинг: Цена: 102480.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images.
Автор: Kirkland Earl J. Название: Advanced Computing in Electron Microscopy ISBN: 3030332624 ISBN-13(EAN): 9783030332624 Издательство: Springer Цена: 139750.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images.
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