Physical Acoustics and Metrology of Fluids, Trusler, Martin
Автор: Hockett, Paul Название: Quantum metrology with photoelectrons, volume ii: applications and advances ISBN: 1643270001 ISBN-13(EAN): 9781643270005 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 76690.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging applications.Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on ""complete"" photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.
Автор: Hockett, Paul Название: Quantum metrology with photoelectrons, volume ii: applications and advances ISBN: 1681746891 ISBN-13(EAN): 9781681746890 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 56370.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging applications.Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on ""complete"" photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.
Автор: Mansfield Название: Metrology and Standardization of Nanotechnology - Protocols and Industrial Innovations ISBN: 3527340394 ISBN-13(EAN): 9783527340392 Издательство: Wiley Рейтинг: Цена: 180520.00 T Наличие на складе: Поставка под заказ. Описание: Meeting the need for a reliable handbook on pertinent metrology approaches in nanomaterials, experts from European, American and Asian standardization bodies provide a balanced and comprehensive overview of the state of the art, highlighting the importance of global standards.
This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.
Автор: S. V. Gupta Название: Mass Metrology ISBN: 3030124649 ISBN-13(EAN): 9783030124649 Издательство: Springer Рейтинг: Цена: 121110.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This second edition of Mass Metrology: The Newly Defined Kilogram has been thoroughly revised to reflect the recent redefinition of the kilogram in terms of Planck’s constant. The necessity of defining the kilogram in terms of physical constants was already underscored in the first edition. However, the kilogram can also be defined in terms of Avogadro’s number, using a collection of ions of heavy elements, by the levitation method, or using voltage and watt balances. The book also addresses the concepts of gravitational, inertial and conventional mass, and describes in detail the variation of acceleration due to gravity. Further topics covered in this second edition include: the effect of gravity variations on the reading of electronic balances derived with respect to latitude, altitude and earth topography; the classification of weights by the OIML; and maximum permissible error in different categories of weights prescribed by national and international organizations. The book also discusses group weighing techniques and the use of nanotechnology for the detection of mass differences as small as 10-24 g. Last but not least, readers will find details on the XRCD method for defining the kilogram in terms of Planck’s constant.
Автор: Hockett, Paul Название: Quantum metrology with photoelectrons, volume i: foundations ISBN: 1681749998 ISBN-13(EAN): 9781681749990 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 92400.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 1: Foundations discusses the fundamental concepts along with recent and emerging applications.The core physics is that of photoionization, and Volume 1 addresses this topic. The foundational material is presented in part as a tutorial with extensive numerical examples and also in part as a collected reference to the relevant theoretical treatments from the literature for a range of cases. Topics are discussed with an eye to developing general quantum metrology schemes, in which full quantum state reconstruction of the photoelectron wavefunction is the goal. In many cases, code and/or additional resources are available online. Consequently, it is hoped that readers at all levels will find something of interest and that the material provides something rather different from existing textbooks.
Автор: Hockett, Paul Название: Quantum metrology with photoelectrons, volume i: foundations ISBN: 1681746859 ISBN-13(EAN): 9781681746852 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 72070.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 1: Foundations discusses the fundamental concepts along with recent and emerging applications.The core physics is that of photoionization, and Volume 1 addresses this topic. The foundational material is presented in part as a tutorial with extensive numerical examples and also in part as a collected reference to the relevant theoretical treatments from the literature for a range of cases. Topics are discussed with an eye to developing general quantum metrology schemes, in which full quantum state reconstruction of the photoelectron wavefunction is the goal. In many cases, code and/or additional resources are available online. Consequently, it is hoped that readers at all levels will find something of interest and that the material provides something rather different from existing textbooks.
Автор: Xavier Silvani Название: Metrology for Fire Experiments in Outdoor Conditions ISBN: 1461479614 ISBN-13(EAN): 9781461479611 Издательство: Springer Рейтинг: Цена: 43530.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Natural fires can be considered as scale-dependant, non-linear processes of mass, momentum and heat transport, resulting from a turbulent reactive and radiative fluid medium flowing over a complex medium, the vegetal fuel.
Автор: Mudiwa Afolayan Название: Metrology & Diagnostic Techniques for Nanoelectronics ISBN: 1681177196 ISBN-13(EAN): 9781681177199 Издательство: Gazelle Book Services Рейтинг: Цена: 230210.00 T Наличие на складе: Невозможна поставка. Описание: Metrology is the science of measurements, and nanometrology is that part of metrology that relates to measurements at the nanoscale. Many governments and regulatory bodies worldwide have existing nanotechnology policies and are taking the preliminary steps towards nanometrology strategies, for example in support of pre-normative R&D and standardisation work. The applications and economic impact of thin films for nanotechnological products are large, and extend over a wide range of industry sectors. As buried layers, thin films are core to the performance of state-of-art microelectronics and magnetic data storage devices. Metrology and Diagnostic Techniques for Nanoelectronics highlights state of art developments in devoted to advancements in all the metrological aspects related to nanoscience and nanotechnology, critical for continuing technology scaling and product innovation. It offers an inclusive overview of engineering metrology and how it relates to micro and nanotechnology research and manufacturing. By combining established knowledge with the latest advances from the field, it presents a comprehensive single volume, written by renowned experts in the respective fields that can be used for professionals, researcher, practitioners and students. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging. The semiconductor industry faces significant challenges to continue increasing performance and functionality of information processing. New and improved metrology and characterisation is required to support these advances in density and functionality. This book brings together scientists and engineers interested in all aspects of the characterisation technology needed for nanoelectronic materials and device research, development, and manufacturing.
Автор: Michael Quinten Название: A Practical Guide to Surface Metrology ISBN: 3030294536 ISBN-13(EAN): 9783030294533 Издательство: Springer Рейтинг: Цена: 93160.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book offers a genuinely practical introduction to the most commonly encountered optical and non-optical systems used for the metrology and characterization of surfaces, including guidance on best practice, calibration, advantages and disadvantages, and interpretation of results. It enables the user to select the best approach in a given context.Most methods in surface metrology are based upon the interaction of light or electromagnetic radiation (UV, NIR, IR), and different optical effects are utilized to get a certain optical response from the surface; some of them record only the intensity reflected or scattered by the surface, others use interference of EM waves to obtain a characteristic response from the surface. The book covers techniques ranging from microscopy (including confocal, SNOM and digital holographic microscopy) through interferometry (including white light, multi-wavelength, grazing incidence and shearing) to spectral reflectometry and ellipsometry. The non-optical methods comprise tactile methods (stylus tip, AFM) as well as capacitive and inductive methods (capacitive sensors, eddy current sensors).The book provides:Overview of the working principlesDescription of advantages and disadvantagesCurrently achievable numbers for resolutions, repeatability, and reproducibilityExamples of real-world applicationsA final chapter discusses examples where the combination of different surface metrology techniques in a multi-sensor system can reasonably contribute to a better understanding of surface properties as well as a faster characterization of surfaces in industrial applications. The book is aimed at scientists and engineers who use such methods for the measurement and characterization ofsurfaces across a wide range of fields and industries, including electronics, energy, automotive and medical engineering.
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