Xinfei Guo; Mircea R. Stan Circadian Rhythms for Future Resilient Electronic Systems 9783030200503

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Автор: Xinfei Guo; Mircea R. Stan
Название: Circadian Rhythms for Future Resilient Electronic Systems
ISBN: 9783030200503
Издательство: Springer
Классификация:

Международное публичное право

Электроника

Схемы и компоненты

Электронные устройства и материалы

Архитектура и логическое построение вычислительных систем

ISBN-10: 3030200507
Обложка/Формат: Hardcover
Страницы: 208
Вес: 0.51 кг.
Дата издания: 2020
Язык: English
Издание: 1st ed. 2020
Иллюстрации: 75 tables, color; 134 illustrations, color; 2 illustrations, black and white; xix, 208 p. 136 illus., 134 illus. in color.
Размер: 234 x 156 x 14
Читательская аудитория: Professional & vocational
Основная тема: Engineering
Подзаголовок: Accelerated Active Self-Healing for Integrated Circuits
Ссылка на Издательство: Link
Рейтинг:
Поставляется из: Германии
Описание: This book describes methods to address wearout/aging degradations in electronic chips and systems, caused by several physical mechanisms at the device level. The authors introduce a novel technique called accelerated active self-healing, which fixes wearout issues by enabling accelerated recovery. Coverage includes recovery theory, experimental results, implementations and applications, across multiple nodes ranging from planar, FD-SOI to FinFET, based on both foundry provided models and predictive models. Presents novel techniques, tested with experiments on real hardware;Discusses circuit and system level wearout recovery implementations, many of these designs are portable and friendly to the standard design flow;Provides circuit-architecture-system infrastructures that enable the accelerated self-healing for future resilient systems;Discusses wearout issues at both transistor and interconnect level, providing solutions that apply to both;Includes coverage of resilient aspects of emerging applications such as IoT.
Дополнительное описание: Introduction to Wearout.- Accelerated Self-Healing Techniques for BTI Wearout.- Accelerating and Activating Recovery for EM Wearout.- Circuit Techniques for Accelerated and Active Recovery.- Accelerated Self-Healing as a Key Design Knob for Cross-Layer Re

Circadian Rhythms for Future Resilient Electronic Systems, Xinfei Guo; Mircea R. Stan