VLSI Design: Circuits, Systems and Applications, Jie Li; A Ravi Sankar; P Augusta Sophy Beulet
Автор: Horowitz Название: The Art of Electronics ISBN: 0521809266 ISBN-13(EAN): 9780521809269 Издательство: Cambridge Academ Рейтинг: Цена: 90810.00 T Наличие на складе: Ожидается поступление. Описание: At long last, here is the thoroughly revised and updated, and long-anticipated, third edition of the hugely successful The Art of Electronics. Widely accepted as the best single authoritative text on electronic circuit design, it will be an indispensable reference and the gold standard for anyone in the field.
Автор: Horowitz Paul Название: The art of electronics The x Chapters ISBN: 1108499945 ISBN-13(EAN): 9781108499941 Издательство: Cambridge Academ Рейтинг: Цена: 59130.00 T Наличие на складе: Заказано в издательстве. Описание: The x-Chapters is the missing pieces of The Art of Electronics, to be used either as its complement, or as a direct route to exploring some of the most exciting and oft-overlooked topics in advanced electronic engineering. Students, researchers and practitioners will find here techniques and circuits that are unavailable elsewhere.
Автор: Hayes Название: Learning the Art of Electronics ISBN: 0521177235 ISBN-13(EAN): 9780521177238 Издательство: Cambridge Academ Рейтинг: Цена: 114630.00 T Наличие на складе: Нет в наличии. Описание: Turn to this book if you want to learn about different types of circuits and their behavior. You will gain a deep and intuitive understanding of circuit operation, be exposed to advanced circuit designs, and learn to build analog and digital devices from first principles using basic components.
Автор: Stephen W. Director; Wojciech Maly; Andrzej J. Str Название: VLSI Design for Manufacturing: Yield Enhancement ISBN: 1461288169 ISBN-13(EAN): 9781461288169 Издательство: Springer Рейтинг: Цена: 78350.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: There are two ways to increase yield: by improving the control of the manufacturing process and by designing the process and the circuits in such a way as to minimize the effect of the inherent variations of the process on performance.
Автор: Ghavami, Behnam, Raji, Mohsen Название: Soft Error Reliability of VLSI Circuits ISBN: 3030516091 ISBN-13(EAN): 9783030516093 Издательство: Springer Рейтинг: Цена: 46570.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.
Автор: Saha, Samar K. Название: FinFET Devices for VLSI Circuits and Systems ISBN: 1138586099 ISBN-13(EAN): 9781138586093 Издательство: Taylor&Francis Рейтинг: Цена: 148010.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: The book provides the basic theory and operating principles of FinFET devices and technology. Accordingly, the book systematically presents an overview of FinFET device architecture and manufacturing processes, detailed formulation of FinFET electrostatic and dynamic device characteristics for IC design and manufacturing.
Автор: Ghavami Behnam, Raji Mohsen Название: Soft Error Reliability of VLSI Circuits: Analysis and Mitigation Techniques ISBN: 3030516121 ISBN-13(EAN): 9783030516123 Издательство: Springer Рейтинг: Цена: 46570.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.
Автор: Senani Raj, Bhaskar Data Ram, Singh Vinod Kumar Название: Gyrators, Simulated Inductors and Related Immittances: Realizations and Applications ISBN: 1785616706 ISBN-13(EAN): 9781785616709 Издательство: Institution of Engineering and Technology Рейтинг: Цена: 197120.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание:
This book provides comprehensive coverage of all major gyrator circuits, simulated inductors and related synthetic impedances. The book offers a thorough review of research in this field, and includes an exceptionally wide range and number of circuit examples. Written by two experts known internationally for their contributions to analogue circuit design, this title covers a broad variety of active devices ranging from bipolar and MOS transistors to the ubiquitous IC op-amps and operational transconductance amplifiers, plus other modern electronic circuits.
Автор: Carver Mead; Mohammed Ismail Название: Analog VLSI Implementation of Neural Systems ISBN: 146128905X ISBN-13(EAN): 9781461289050 Издательство: Springer Рейтинг: Цена: 130610.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This volume contains the proceedings of a workshop on Analog Integrated Neural Systems held May 8, 1989, in connection with the International Symposium on Circuits and Systems.
Автор: Emad N. Farag; Mohamed I. Elmasry Название: Mixed Signal VLSI Wireless Design ISBN: 147578287X ISBN-13(EAN): 9781475782875 Издательство: Springer Рейтинг: Цена: 111790.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Today one of the most challenging areas for VLSI designers is VLSI circuit and system design for wireless applications. The challenge is immense and the need for new generation of VLSI designers, who are fluent in wireless communication and are masters of mixed signal design, is great.
Автор: Michel S. Nakhla; Q.J. Zhang Название: Modeling and Simulation of High Speed VLSI Interconnects ISBN: 0792394410 ISBN-13(EAN): 9780792394419 Издательство: Springer Рейтинг: Цена: 121110.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Modeling and Simulation of High Speed VLSI Interconnects brings together in one place important contributions and state-of-the-art research results in this rapidly advancing area.
Автор: Ravi K. Gulati; Charles F. Hawkins Название: IDDQ Testing of VLSI Circuits ISBN: 0792393155 ISBN-13(EAN): 9780792393153 Издательство: Springer Рейтинг: Цена: 121110.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: For sequential circuits, in particular, the complexity of finding suitable tests is very high. In comparison, the IDDQ test does not observe the logic states, but measures the integrated current that leaks through all gates. In other words, it is like measuring a patient`s temperature to determine the state of health.
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