Nicholas D. Kay Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals 9783319888989

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Автор: Nicholas D. Kay
Название: Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals
ISBN: 9783319888989
Издательство: Springer
Классификация:

Физика конденсированных сред (физика веществ в жидком и твёрдом состоянии)

Спектральный анализ, спектрохимия, масс-спектрометрия

Нанотехнология

Экология, охрана окружающей среды, экологичные технологии

ISBN-10: 3319888986
Обложка/Формат: Soft cover
Страницы: 122
Вес: 0.23 кг.
Дата издания: 2018
Серия: Springer Theses
Язык: English
Издание: Softcover reprint of
Иллюстрации: 14 tables, color; 14 illustrations, color; 53 illustrations, black and white; xxi, 122 p. 67 illus., 14 illus. in color.
Размер: Book (Paperback Initiative)
Читательская аудитория: Professional & vocational
Основная тема: Physics
Подзаголовок: A Scanning Probe Microscopy Approach
Ссылка на Издательство: Link
Рейтинг:
Поставляется из: Германии
Описание: This thesis introduces a unique approach of applying atomic force microscopy to study the nanoelectromechanical properties of 2D materials, providing high-resolution computer-generated imagery (CGI) and diagrams to aid readers’ understanding and visualization. The isolation of graphene and, shortly after, a host of other 2D materials has attracted a great deal of interest in the scientific community for both their range of extremely desirable and their record-breaking properties. Amongst these properties are some of the highest elastic moduli and tensile strengths ever observed in nature. The work, which was undertaken at Lancaster University’s Physics department in conjunction with the University of Manchester and the National Physical Laboratory, offers a new approach to understanding the nanomechanical and nanoelectromechanical properties of 2D materials by utilising the nanoscale and nanosecond resolution of ultrasonic force and heterodyne force microscopy (UFM and HFM) – both contact mode atomic force microscopy (AFM) techniques. Using this approach and developing several other new techniques the authors succeeded in probing samples’ subsurface and mechanical properties, which would otherwise remain hidden. Lastly, by using a new technique, coined electrostatic heterodyne force microscopy (E-HFM), the authors were able to observe nanoscale electromechanical vibrations with a nanometre and nanosecond resolution, in addition to probing the local electrostatic environment of devices fabricated from 2D materials.
Дополнительное описание: Introduction.- Background.- Materials and Methods.- Morphology of 2D Materials and their Heterostructures.- Nanomechanical Phenomena.- Nanoelectromechanical Phenomena.- Further Work and Future Directions.- Conclusion.

Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals, Nicholas D. Kay