Автор: Popoff Andrey Название: Fundamentals of Signal Processing in Generalized Metric Spaces: Algorithms and Applications ISBN: 1032231254 ISBN-13(EAN): 9781032231259 Издательство: Taylor&Francis Рейтинг: Цена: 168430.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Exploring the interrelations between generalized metric spaces, lattice-ordered groups, and order statistics, the book contains a new algebraic approach to Signal Processing Theory. It describes mathematical concepts and results important in the development, analysis, and optimization of signal processing algorithms.
Автор: Yossi Rubner; Carlo Tomasi Название: Perceptual Metrics for Image Database Navigation ISBN: 1441948635 ISBN-13(EAN): 9781441948632 Издательство: Springer Рейтинг: Цена: 194730.00 T Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Keimel Christian Название: Design of Video Quality Metrics with Multi-Way Data Analysis: A Data Driven Approach ISBN: 9811091196 ISBN-13(EAN): 9789811091193 Издательство: Springer Рейтинг: Цена: 93160.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Introduction.- Video Quality.- Video Quality Metrics.- Data Analysis Approach.- Two-way Data Analysis.- Multi-way Data Analysis.- Model Building Considerations.- Designing Video Quality Metrics.- Performance Comparison.- Conclusion.
Автор: Evren Samur Название: Performance Metrics for Haptic Interfaces ISBN: 1447158032 ISBN-13(EAN): 9781447158035 Издательство: Springer Рейтинг: Цена: 111790.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book meets the need to understand performance metrics for haptic interfaces and their implications on device design, use and application. The authors propose evaluation practices including a combined physical and psychophysical experimental methodology.
Автор: Krig Scott Название: Computer Vision Metrics: Survery, Taxonomy and Analysis of Computer Vision, Visual Neuroscience, and Deep Learning ISBN: 3319815954 ISBN-13(EAN): 9783319815954 Издательство: Springer Рейтинг: Цена: 74530.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Based on the successful 2014 book published by Apress, this textbook edition is expanded to provide a comprehensive history and state-of-the-art survey for fundamental computer vision methods and deep learning.
Автор: Fabio Bonsignorio; Elena Messina; Angel P. del Pob Название: Metrics of Sensory Motor Coordination and Integration in Robots and Animals ISBN: 3030141241 ISBN-13(EAN): 9783030141240 Издательство: Springer Рейтинг: Цена: 93160.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание:
This book focuses on a critical issue in the study of physical agents, whether natural or artificial: the quantitative modelling of sensory–motor coordination.
Adopting a novel approach, it defines a common scientific framework for both the intelligent systems designed by engineers and those that have evolved naturally. As such it contributes to the widespread adoption of a rigorous quantitative and refutable approach in the scientific study of ‘embodied’ intelligence and cognition.
More than 70 years after Norbert Wiener’s famous book Cybernetics: or Control and Communication in the Animal and the Machine (1948), robotics, AI and life sciences seem to be converging towards a common model of what we can call the ‘science of embodied intelligent/cognitive agents’.
This book is interesting for an interdisciplinary community of researchers, technologists and entrepreneurs working at the frontiers of robotics and AI, neuroscience and general life and brain sciences.
Автор: Yossi Rubner; Carlo Tomasi Название: Perceptual Metrics for Image Database Navigation ISBN: 0792372190 ISBN-13(EAN): 9780792372196 Издательство: Springer Рейтинг: Цена: 194730.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Introduces the metric, called the Earth Mover's Distance (EMD), for comparing images in terms of their appearance. This title includes a CD-ROM with full color images and is useful to researchers, industrial professionals, and students in the fields of Computer Vision; Image Processing; Data Mining; and Digital Libraries.
Автор: Christian Keimel Название: Design of Video Quality Metrics with Multi-Way Data Analysis ISBN: 9811002681 ISBN-13(EAN): 9789811002687 Издательство: Springer Рейтинг: Цена: 121890.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Introduction.- Video Quality.- Video Quality Metrics.- Data Analysis Approach.- Two-way Data Analysis.- Multi-way Data Analysis.- Model Building Considerations.- Designing Video Quality Metrics.- Performance Comparison.- Conclusion.
Название: Advanced Ultrawideband Radar ISBN: 0367868148 ISBN-13(EAN): 9780367868147 Издательство: Taylor&Francis Рейтинг: Цена: 83690.00 T Наличие на складе: Невозможна поставка. Описание: This book presents the latest theory, developments, and applications related to high resolution materials-penetrating sensor systems. An international team of expert researchers explains the problems and solutions for developing new techniques and applications. Subject areas include ultrawideband (UWB) signals propagation and scattering, materia
Автор: Gonzalez Guillermo Название: Advanced Electromagnetic Wave Propagation Methods ISBN: 1032113707 ISBN-13(EAN): 9781032113708 Издательство: Taylor&Francis Рейтинг: Цена: 148010.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This textbook provides a solid foundation into the approaches used in the analysis of complex electromagnetic problems and wave propagation. The techniques discussed are essential to obtain closed-form solutions or asymptotic solutions and meet an existing need for instructors and students in electromagnetic theory.
Автор: Hamilton B. Carter; Shankar G. Hemmady Название: Metric Driven Design Verification ISBN: 1441942556 ISBN-13(EAN): 9781441942555 Издательство: Springer Рейтинг: Цена: 113180.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: The purpose of the book is to train verification engineers on the breadth of technologies available and to give them a utilitarian methodology for making effective use of those technologies. The book is easy to understand and a joy to read.
Автор: Manoj Sachdev; Jose Pineda de Gyvez Название: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits ISBN: 1441942858 ISBN-13(EAN): 9781441942852 Издательство: Springer Рейтинг: Цена: 174130.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.
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