Measurement Uncertainty, Ronald H. Dieck

Автор: Ohta, Jun
Название: Smart CMOS Image Sensors and Applications, Second Edition
ISBN: 1498764649 ISBN-13(EAN): 9781498764643
Издательство: Taylor&Francis
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Цена: 132710.00 T
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Описание: This book provides the state-of-the-art of CMOS image sensors and applications. The book describes the fundamentals of CMOS image sensors, optoelectronic device physics, and introduces typical CMOS image sensor structures, such as an active pixel sensor (APS).

Автор: Sarkar
Название: Ad Hoc Mobile Wireless Networks
ISBN: 1138198811 ISBN-13(EAN): 9781138198814
Издательство: Taylor&Francis
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Цена: 58170.00 T
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Описание:

The military, the research community, emergency services, and industrial environments all rely on ad hoc mobile wireless networks because of their simple infrastructure and minimal central administration. Now in its second edition, Ad Hoc Mobile Wireless Networks: Principles, Protocols, and Applications explains the concepts, mechanism, design, and performance of these highly valued systems.

Following an overview of wireless network fundamentals, the book explores MAC layer, routing, multicast, and transport layer protocols for ad hoc mobile wireless networks. Next, it examines quality of service and energy management systems. Additional chapters cover mobility models for multi-hop ad hoc wireless networks as well as cross-layer design issues.

Exploring Bluetooth, IrDA (Infrared Data Association), HomeRF, WiFi, WiMax, Wireless Internet, and Mobile IP, the book contains appropriate examples and problems at the end of each chapter to illustrate each concept. This second edition has been completely updated with the latest technology and includes a new chapter on recent developments in the field, including sensor networks, personal area networks (PANs), smart dress, and vehicular ad hoc networks.

Self-organized, self-configured, and self-controlled, ad hoc mobile wireless networks will continue to be valued for a range of applications, as they can be set up and deployed anywhere and anytime. This volume captures the current state of the field as well as upcoming challenges awaiting researchers.

Автор: Paolo Fornasini
Название: The Uncertainty in Physical Measurements
ISBN: 1441926941 ISBN-13(EAN): 9781441926944
Издательство: Springer
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Цена: 95770.00 T
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Описание: An introduction to the treatment of uncertainty in a phenomenological way, based on examples taken from laboratory experience and distinguishing the causes of uncertainty (there are more than just random errors and Gaussian distributions to consider).

Автор: Semyon G. Rabinovich
Название: Measurement Errors and Uncertainties
ISBN: 1441920536 ISBN-13(EAN): 9781441920539
Издательство: Springer
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Цена: 95770.00 T
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Описание: A practical reference on theory and methods of estimating measurement errors and uncertainty for both scientists and engineers in industry and experimental research.

Автор: Colin Ratcliffe; Bridget Ratcliffe
Название: Doubt-Free Uncertainty In Measurement
ISBN: 3319364472 ISBN-13(EAN): 9783319364476
Издательство: Springer
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Цена: 87060.00 T
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This volume presents measurement uncertainty and uncertainty budgets in a form accessible to practicing engineers and engineering students from across a wide range of disciplines. The book gives a detailed explanation of the methods presented by NIST in the "GUM" - Guide to Uncertainty of Measurement. Emphasis is placed on explaining the background and meaning of the topics, while keeping the level of mathematics at the minimum level necessary. Dr. Colin Ratcliffe, USNA, and Bridget Ratcliffe, Johns Hopkins, develop uncertainty budgets and explain their use. In some examples, the budget may show a process is already adequate and where costs can be saved. In other examples, the budget may show the process is inadequate and needs improvement. The book demonstrates how uncertainty budgets help identify the most cost effective place to make changes. In addition, an extensive fully-worked case study leads readers through all issues related to an uncertainty analysis, including a variety of different types of uncertainty budgets. The book is ideal for professional engineers and students concerned with a broad range of measurement assurance challenges in applied sciences.

This book also:

Facilitates practicing engineers' understanding of uncertainty budgets, essential to calculating cost-effective savings to a wide variety of processes contingent on measurement

Presents uncertainty budgets in an accessible style suitable for all undergraduate STEM courses that include a laboratory component

Provides a highly adaptable supplement to graduate textbooks for courses where students' work includes reporting on experimental results

Includes an expanded case study developing uncertainty from transducers though measurands and propagated to the final measurement that can be used as a template for the analysis of many processes

Stands as a useful pocket reference for all engineers and experimental scientists

Автор: Colin Ratcliffe; Bridget Ratcliffe
Название: Doubt-Free Uncertainty In Measurement
ISBN: 331912062X ISBN-13(EAN): 9783319120621
Издательство: Springer
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Цена: 104480.00 T
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Автор: Hand, David J.
Название: Measurement: A Very Short Introduction
ISBN: 0198779569 ISBN-13(EAN): 9780198779568
Издательство: Oxford Academ
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Цена: 10550.00 T
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Описание: This Very Short Introduction explores the concept of measurement, its mathematical underpinnings, and its wide range of application from the sciences and social sciences to economics and commerce.

Автор: Enrique Castillo; E. Alvarez
Название: Expert Systems: Uncertainty and Learning
ISBN: 1851666648 ISBN-13(EAN): 9781851666645
Издательство: Springer
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Цена: 254350.00 T
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Описание: A general introduction to expert systems dealing with uncertainty and learning methods; describing the most common methods and pointing out their deficiencies.

Автор: Van-Nam Huynh; Yoshiteru Nakamori; Jonathan Lawry;
Название: Integrated Uncertainty Management and Applications
ISBN: 364211959X ISBN-13(EAN): 9783642119590
Издательство: Springer
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Цена: 232910.00 T
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Описание: The 2010 International Symposium on Integrated Uncertainty Management and Applications (IUM`2010), which takes place at the Japan Advanced Institute of Science and Technology (JAIST), Ishikawa, Japan, between 9th-11th April, is therefore conceived as a forum for the discussion and exchange of research results, ideas for and experience of application among researchers and practitioners involved with all aspects of uncertainty modelling and management.