Advanced Photon Counting Techniques XI, Mark Itzler

Автор: Ciminelli Caterina, Armenise Mario Nicola & Dell`O
Название: Photonics In Space: Advanced Photonic Devices And Systems
ISBN: 9814725102 ISBN-13(EAN): 9789814725101
Издательство: World Scientific Publishing
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Цена: 103490.00 T
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Описание: The book focuses on photonic devices and systems for space applications and critically reviews the most promising research advances in the field of photonic technologies, which may have a significant impact on the performance of space systems.

Автор: E.O. Schulz-Dubois
Название: Photon Correlation Techniques in Fluid Mechanics
ISBN: 3662135299 ISBN-13(EAN): 9783662135297
Издательство: Springer
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Цена: 113190.00 T
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Описание: Photon correlation is a kind of spectroscopy designed to identify optical frequency shifts and line-broadening effects in the range of many MHz down to a few Hz. The resulting photon correlation func- tion, a function in the time domain, contains the desired spectral informa- tion, which may be extracted by a suitable algorithm.

Автор: Ivan Prochazka, Roman Sobolewski, Ralph James
Название: Photon Counting Applications 2017
ISBN: 1510609598 ISBN-13(EAN): 9781510609594
Издательство: Mare Nostrum (Eurospan)
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Цена: 71150.00 T
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Mark Itzler
Название: Advanced Photon Counting Techniques XII
ISBN: 1510618295 ISBN-13(EAN): 9781510618299
Издательство: Mare Nostrum (Eurospan)
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Цена: 71150.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Peter Kapusta; Michael Wahl; Rainer Erdmann
Название: Advanced Photon Counting
ISBN: 3319156357 ISBN-13(EAN): 9783319156354
Издательство: Springer
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Цена: 261210.00 T
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Описание: This volume focuses on Time-Correlated Single Photon Counting (TCSPC), a powerful tool allowing luminescence lifetime measurements to be made with high temporal resolution, even on single molecules.

Автор: Oleg Mitrofanov, Chee Hing Tan, Jose Luis Pau Vizcaino
Название: Optical Sensing, Imaging, and Photon Counting: From X-Rays to THz
ISBN: 151062029X ISBN-13(EAN): 9781510620292
Издательство: Mare Nostrum (Eurospan)
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Цена: 71150.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Manijeh Razeghi, Dorota S. Temple, Gail J. Brown
Название: Optical Sensing, Imaging, and Photon Counting: Nanostructured Devices and Applications 2016
ISBN: 1510602577 ISBN-13(EAN): 9781510602571
Издательство: Mare Nostrum (Eurospan)
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Цена: 71150.00 T
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Manijeh Razeghi, Oleg Mitrofanov, Jose Luis Pau Vizcaino, Chee Hing Tan
Название: Optical Sensing, Imaging, and Photon Counting: Nanostructured Devices and Applications 2017
ISBN: 1510611630 ISBN-13(EAN): 9781510611634
Издательство: Mare Nostrum (Eurospan)
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Цена: 81310.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.