Nanoimaging and Nanospectroscopy VI, Prabhat Verma, Alexander Egner
Автор: Prabhat Verma, Alexander Egner Название: Nanoimaging and Nanospectroscopy III ISBN: 162841720X ISBN-13(EAN): 9781628417203 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 107190.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.
Автор: Prabhat Verma, Alexander Egner Название: Nanoimaging and Nanospectroscopy IV ISBN: 1510602410 ISBN-13(EAN): 9781510602410 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 78540.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.
Автор: Prabhat Verma, Alexander Egner Название: Nanoimaging and Nanospectroscopy V ISBN: 1510611576 ISBN-13(EAN): 9781510611573 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 81310.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Автор: Barry Lai, Andrea Somogyi Название: X-Ray Nanoimaging: Instruments and Methods III ISBN: 1510612351 ISBN-13(EAN): 9781510612358 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 91470.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Автор: Barry Lai Название: X-Ray Nanoimaging: Instruments and Methods II ISBN: 1628417587 ISBN-13(EAN): 9781628417586 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 81310.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.
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