Degraded Environments: Sensing, Processing, and Display 2018, John Sanders-Reed, Jarvis Arthur

Автор: John Sanders-Reed, Jarvis Arthur
Название: Degraded Environments: Sensing, Processing, and Display 2017
ISBN: 1510608958 ISBN-13(EAN): 9781510608955
Издательство: Mare Nostrum (Eurospan)
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Цена: 81310.00 T
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Thilo Erbertseder, Nektarios Chrysoulakis, Ying Zhang
Название: Remote Sensing Technologies and Applications in Urban Environments III
ISBN: 1510621695 ISBN-13(EAN): 9781510621695
Издательство: Mare Nostrum (Eurospan)
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Цена: 107190.00 T
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: John Sanders-Reed, Jarvis Arthur
Название: Degraded Visual Environments: Enhanced, Synthetic, and External Vision Solutions 2016
ISBN: 1510600809 ISBN-13(EAN): 9781510600805
Издательство: Mare Nostrum (Eurospan)
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Цена: 81310.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Thilo Erbertseder, Nektarios Chrysoulakis, Ying Zhang, Wieke Heldens
Название: Remote Sensing Technologies and Applications in Urban Environments II
ISBN: 1510613269 ISBN-13(EAN): 9781510613263
Издательство: Mare Nostrum (Eurospan)
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Цена: 91470.00 T
Наличие на складе: Невозможна поставка.
Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.