Optical Biopsy XV: Toward Real-Time Spectroscopic Imaging and Diagnosis, Robert Alfano, Stavros Demos

Автор: Baldassare Di Bartolo (Editor)
Название: Ultrafast Dynamics of Quantum Systems: Physical Processes and Spectroscopic Techniques
ISBN: 1475771363 ISBN-13(EAN): 9781475771367
Издательство: Springer
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Описание: Proceedings of a NATO ASI held in Erice, Italy, June 15-30, 1997

Автор: Robert Alfano, Stavros Demos
Название: Optical Biopsy XVI: Toward Real-Time Spectroscopic Imaging and Diagnosis
ISBN: 151061463X ISBN-13(EAN): 9781510614635
Издательство: Mare Nostrum (Eurospan)
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Автор: Mark Druy, Richard Crocombe, Steven Barnett, Luisa Profeta
Название: Next-Generation Spectroscopic Technologies X
ISBN: 1510609210 ISBN-13(EAN): 9781510609211
Издательство: Mare Nostrum (Eurospan)
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Описание: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Автор: Eversberg, Thomas Vollmann, Klaus
Название: Spectroscopic instrumentation
ISBN: 3662445344 ISBN-13(EAN): 9783662445341
Издательство: Springer
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Описание: Spectroscopic Instrumentation

Автор: Mark Druy, Richard Crocombe, Steven Barnett, Luisa Profeta, Abul Azad
Название: Next-Generation Spectroscopic Technologies XI
ISBN: 1510618252 ISBN-13(EAN): 9781510618251
Издательство: Mare Nostrum (Eurospan)
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Цена: 91470.00 T
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.