Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, Civil Infrastructure, and Transportation XII, Peter Shull
Автор: Theodore Matikas Название: Smart Materials and Nondestructive Evaluation for Energy Systems IV ISBN: 1510616985 ISBN-13(EAN): 9781510616981 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 71150.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Автор: H. Felix Wu, Andrew Gyekenyesi, Peter Shull, Tzu-Yang Yu Название: Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, and Civil Infrastructure 2017 ISBN: 1510608230 ISBN-13(EAN): 9781510608238 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 168170.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Автор: Norbert Meyendorf Название: Smart Materials and Nondestructive Evaluation for Energy Systems 2017 ISBN: 1510608273 ISBN-13(EAN): 9781510608276 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 81310.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
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