Radiation Effects in Advanced Semiconductor Materials and Devices, C. Claeys; E. Simoen

Название: Nondestructive evaluation of semiconductor materials and devices
ISBN: 1475713541 ISBN-13(EAN): 9781475713541
Издательство: Springer
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Цена: 81050.00 T
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Описание: From September 19-29, a NATO Advanced Study Institute on Non- destructive Evaluation of Semiconductor Materials and Devices was held at the Villa Tuscolano in Frascati, Italy.

Автор: Osamu Ueda; Stephen J. Pearton
Название: Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
ISBN: 1493901192 ISBN-13(EAN): 9781493901197
Издательство: Springer
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Цена: 156720.00 T
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Описание: This book covers reliability procedures for lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Addresses reliability engineering, materials, reliability testing and electronic characterization.

Автор: K.M. Gupta; Nishu Gupta
Название: Advanced Semiconducting Materials and Devices
ISBN: 3319197576 ISBN-13(EAN): 9783319197579
Издательство: Springer
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Цена: 130610.00 T
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Описание: A wide range of topics are covered, including optoelectronic devices, metal-semiconductor junctions, heterojunctions, MISFETs, LEDs, semiconductor lasers, photodiodes, switching diodes, tunnel diodes, Gunn diodes, solar cells, varactor diodes, IMPATT diodes, and advanced semiconductors.

Автор: Ibe
Название: Environmental Radiation Effects in ULSI Devices and Electronic Systems
ISBN: 1118479297 ISBN-13(EAN): 9781118479292
Издательство: Wiley
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Цена: 127720.00 T
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Описание: This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions.