Simulation Techniques and Solutions for Mixed-Signal Coupling in Integrated Circuits, Nishath K. Verghese; Timothy J. Schmerbeck; David

Автор: Nishath K. Verghese; Timothy J. Schmerbeck; David
Название: Simulation Techniques and Solutions for Mixed-Signal Coupling in Integrated Circuits
ISBN: 1461359422 ISBN-13(EAN): 9781461359425
Издательство: Springer
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Цена: 130610.00 T
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Автор: Gordon W. Roberts; Albert K. Lu
Название: Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits
ISBN: 0792395646 ISBN-13(EAN): 9780792395645
Издательство: Springer
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Цена: 158340.00 T
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Описание: Offers an introduction to the testing problem and a review of conventional signal generation techniques. This book describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion.

Автор: Piet Wambacq; Georges Gielen; John Gerrits
Название: Low-Power Design Techniques and CAD Tools for Analog and RF Integrated Circuits
ISBN: 1475783965 ISBN-13(EAN): 9781475783964
Издательство: Springer
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Цена: 139750.00 T
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Описание: This unique book provides an overview of the current state of the art and very recent research results that have been achieved as part of the Low-Power Initiative of the European Union, in the field of analogue, RF and mixed-signal design methodologies and CAD tools.

Автор: X. Aragones; J.L. Gonzalez; Antonio Rubio
Название: Analysis and Solutions for Switching Noise Coupling in Mixed-Signal ICs
ISBN: 0792385047 ISBN-13(EAN): 9780792385042
Издательство: Springer
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Цена: 156720.00 T
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Описание: Takes a look at coupling through the common silicon substrate, and noise at the power supply lines. This book explains the elementary knowledge needed to understand these phenomena and presents a review of works and research results. It is suitable as an introductory material to noise-coupling problems in mixed-signal ICs.

Автор: St?phane Donnay; Georges Gielen
Название: Substrate Noise Coupling in Mixed-Signal ASICs
ISBN: 1441953418 ISBN-13(EAN): 9781441953414
Издательство: Springer
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Цена: 174130.00 T
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Описание: This book is the first in a series of three dedicated to advanced topics in Mixed-Signal IC design methodologies.

Автор: Thomas Scaffidi
Название: Weak-Coupling Theory of Topological Superconductivity
ISBN: 3319628666 ISBN-13(EAN): 9783319628660
Издательство: Springer
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Цена: 102480.00 T
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Описание: Lastly, the thesis makes predictions for the properties of the material under uniaxial strain, which are in good agreement with recent experiments -resolving the mystery of the so-called 3K phase, and suggesting the intriguing possibility that under strain the superconductor may become conventional.

Автор: Rafael Castro L?pez; Francisco V. Fern?ndez; ?scar
Название: Reuse-Based Methodologies and Tools in the Design of Analog and Mixed-Signal Integrated Circuits
ISBN: 9048172896 ISBN-13(EAN): 9789048172894
Издательство: Springer
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Цена: 194730.00 T
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Описание: This book presents a framework for the reuse-based design of AMS circuits. The framework is founded on three key elements: (1) a CAD-supported hierarchical design flow; The book features a detailed tutorial and in-depth coverage of all issues and must-have properties of reusable AMS blocks.

Автор: K. Antreich; R. Bulirsch; A. Gilg; P. Rentrop
Название: Modeling, Simulation, and Optimization of Integrated Circuits
ISBN: 3034894260 ISBN-13(EAN): 9783034894265
Издательство: Springer
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Цена: 93160.00 T
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Описание:

In November 2001 the Mathematical Research Center at Oberwolfach, Germany, hosted the third Conference on Mathematical Models and Numerical Simulation in Electronic Industry. It brought together researchers in mathematics, electrical engineering and scientists working in industry.

Автор: Jose Luis Huertas D?az
Название: Test and Design-for-Testability in Mixed-Signal Integrated Circuits
ISBN: 1441954228 ISBN-13(EAN): 9781441954220
Издательство: Springer
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Цена: 144410.00 T
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Описание: Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods.