Modeling of Electrical Overstress in Integrated Circuits, Carlos H. Diaz; Sung-Mo (Steve) Kang; Charvaka Duv

Автор: K. Antreich; R. Bulirsch; A. Gilg; P. Rentrop
Название: Modeling, Simulation, and Optimization of Integrated Circuits
ISBN: 3034894260 ISBN-13(EAN): 9783034894265
Издательство: Springer
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Цена: 93160.00 T
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In November 2001 the Mathematical Research Center at Oberwolfach, Germany, hosted the third Conference on Mathematical Models and Numerical Simulation in Electronic Industry. It brought together researchers in mathematics, electrical engineering and scientists working in industry.

Автор: Khaled Salah; Yehea Ismail; Alaa El-Rouby
Название: Arbitrary Modeling of TSVs for 3D Integrated Circuits
ISBN: 3319374974 ISBN-13(EAN): 9783319374970
Издательство: Springer
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Цена: 95770.00 T
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Описание: This book presents a wide-band and technology independent, SPICE-compatible RLC model for through-silicon vias (TSVs) in 3D integrated circuits.

Автор: Nasar, S.a.
Название: 3,000 solved problems in electrical circuits
ISBN: 0070459363 ISBN-13(EAN): 9780070459366
Издательство: McGraw-Hill
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Цена: 50330.00 T
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Описание: Offers a diagram-packed timesaver to help you master several types of problem you`ll face on tests. This book contains problems that cover every area of electric circuits, from basic units to complex multi-phase circuits, two-port networks, and the use of Laplace transforms.

Автор: Jian Cheng Zhang; M.A. Styblinski
Название: Yield and Variability Optimization of Integrated Circuits
ISBN: 0792395514 ISBN-13(EAN): 9780792395515
Издательство: Springer
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Цена: 158380.00 T
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Описание: Deals with the primary and theoretical and practical aspects of IC statistical design and covers the important issues of IC statistical design and the relevant mathematical framework. This book is intended as introductory reference material for various groups of IC designers.

Автор: Patrick DeWilde; Zhen-Qiu Ning
Название: Models for Large Integrated Circuits
ISBN: 1461288339 ISBN-13(EAN): 9781461288336
Издательство: Springer
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Цена: 144410.00 T
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Описание: A modern microelectronic circuit can be compared to a large construction, a large city, on a very small area.

Автор: Prithviraj Kabisatpathy; Alok Barua; Satyabroto Si
Название: Fault Diagnosis of Analog Integrated Circuits
ISBN: 038725742X ISBN-13(EAN): 9780387257426
Издательство: Springer
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Цена: 130610.00 T
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Описание: Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. This title examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. It covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces.

Автор: Jianfeng Luo; David A. Dornfeld
Название: Integrated Modeling of Chemical Mechanical Planarization for Sub-Micron IC Fabrication
ISBN: 364206115X ISBN-13(EAN): 9783642061158
Издательство: Springer
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Цена: 194730.00 T
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Описание: Chemical mechanical planarization, or chemical mechanical polishing as it is simultaneously referred to, has emerged as one of the critical processes in semiconductor manufacturing and in the production of other related products and devices, MEMS for example.

Автор: Geert Van der Plas; Georges Gielen; Willy M.C. San
Название: A Computer-Aided Design and Synthesis Environment for Analog Integrated Circuits
ISBN: 0792376978 ISBN-13(EAN): 9780792376972
Издательство: Springer
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Цена: 156720.00 T
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Описание: Addresses the design methodologies and CAD tools available for the systematic design and design automation of analogue integrated circuits. This title discusses two complementary approaches that increase analogue design productivity, demonstrated throughout using design times of the different design experiments undertaken.

Автор: Tobias Erlbacher
Название: Lateral Power Transistors in Integrated Circuits
ISBN: 3319345206 ISBN-13(EAN): 9783319345208
Издательство: Springer
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Цена: 95770.00 T
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Описание: This book details and compares recent advancements in the development of novel lateral power transistors (LDMOS devices) for integrated circuits in power electronic applications. It includes the state-of-the-art concept of double-acting RESURF topologies.

Автор: Sung Kyu Lim
Название: Design for High Performance, Low Power, and Reliable 3D Integrated Circuits
ISBN: 1489986960 ISBN-13(EAN): 9781489986962
Издательство: Springer
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Цена: 113180.00 T
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Описание: This book describes a variety of algorithms and software tools, dedicated to the physical design of through-silicon-via (TSV) based, three-dimensional integrated circuits. It provides full details of all key algorithms, for maximum understanding and utility.

Автор: Donald O. Pederson; Kartikeya Mayaram
Название: Analog Integrated Circuits for Communication
ISBN: 1441943242 ISBN-13(EAN): 9781441943248
Издательство: Springer
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Цена: 78350.00 T
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Описание: Review of Communication Systems, Transistor Models, and Distortion Generation.- Large-Signal Performance of the Basic Gain Stages in Analog ICs.- Amplifier Power Series and Distortion.- Distortion Generation with Source Resistance and Nonlinear Beta.- Distortion in Feedback Amplifiers.- Basic IC Output Stages.- Transformers.- Tuned Circuits in Bandpass Amplifiers.- Simple Bandpass Amplifiers.- Basic Electronic Oscillators.- Electronic Oscillators with Bias-Shift Limiting.- Relaxation and Voltage-Controlled Oscillators.- Analog Multipliers, Mixers, Modulators.- Demodulators and Detectors.- Phase-Locked Loops.- Erratum.

Автор: Rafael Castro L?pez; Francisco V. Fern?ndez; ?scar
Название: Reuse-Based Methodologies and Tools in the Design of Analog and Mixed-Signal Integrated Circuits
ISBN: 9048172896 ISBN-13(EAN): 9789048172894
Издательство: Springer
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Цена: 194730.00 T
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Описание: This book presents a framework for the reuse-based design of AMS circuits. The framework is founded on three key elements: (1) a CAD-supported hierarchical design flow; The book features a detailed tutorial and in-depth coverage of all issues and must-have properties of reusable AMS blocks.