Microanalysis of Solids, B.G. Yacobi; L.L. Kazmerski; D.B. Holt
Автор: Patrick Echlin Название: Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis ISBN: 0387857303 ISBN-13(EAN): 9780387857305 Издательство: Springer Рейтинг: Цена: 97820.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
Автор: E.K. Polychroniadis; Ahmet Yavuz Oral; Mehmet Ozer Название: 2nd International Multidisciplinary Microscopy and Microanalysis Congress ISBN: 3319169181 ISBN-13(EAN): 9783319169187 Издательство: Springer Рейтинг: Цена: 191560.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: The 2nd International Multidisciplinary Microscopy and Microanalysis Congress & Exhibition (InterM 2014) was held on 16-19 October 2014 in Oludeniz, Fethiye/ Mugla, Turkey.The aim of the congress was to gather scientists from various branches and discuss the latest improvements in the field of microscopy.
The 3rd International Multidisciplinary Microscopy Congress (InterM2015), held from 19 to 23 October 2015, focused on the latest developments concerning applications of microscopy in the biological, physical and chemical sciences at all dimensional scales, advances in instrumentation, techniques in and educational materials on microscopy. These proceedings gather 17 peer-reviewed technical papers submitted by leading academic and research institutions from nine countries and representing some of the most cutting-edge research available.
Автор: Goldstein Название: Scanning Electron Microscopy and X-ray Microanalysis ISBN: 0306472929 ISBN-13(EAN): 9780306472923 Издательство: Springer Рейтинг: Цена: 93160.00 T Наличие на складе: Невозможна поставка. Описание: This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis.
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