Integrated Circuit Defect-Sensitivity: Theory and Computational Models, Jos? Pineda de Gyvez

Автор: Manoj Sachdev; Jose Pineda de Gyvez
Название: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
ISBN: 1441942858 ISBN-13(EAN): 9781441942852
Издательство: Springer
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Цена: 174130.00 T
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Описание: The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.

Автор: Assem Deif
Название: Sensitivity Analysis in Linear Systems
ISBN: 3642827411 ISBN-13(EAN): 9783642827419
Издательство: Springer
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Цена: 102480.00 T
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Описание: A text surveying perturbation techniques and sensitivity analysis of linear systems is an ambitious undertaking, considering the lack of basic comprehensive texts on the subject.

Автор: C.H. Stapper; V.K. Jain; Gabriele Saucier
Название: Defect and Fault Tolerance in VLSI Systems
ISBN: 1475799594 ISBN-13(EAN): 9781475799590
Издательство: Springer
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Цена: 139750.00 T
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Описание: Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems.

Автор: Telman Aliev
Название: Digital Noise Monitoring of Defect Origin
ISBN: 1441944109 ISBN-13(EAN): 9781441944108
Издательство: Springer
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Цена: 158380.00 T
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Описание: This book explores the initial stage of the origin of the defect taking into account technical, biological, and other features of several technologies. These technologies allow the defect monitoring at the beginning of the defect origin to be performed at the expense of extracting information from the noise.