Cadmium based II-VI Semiconducting Nanomaterials, Abdul Majid; Maryam Bibi

Автор: Adachi
Название: Properties of Semiconductor Alloys: Group-IV, III-V and II-VI Semiconductors
ISBN: 0470743697 ISBN-13(EAN): 9780470743690
Издательство: Wiley
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Цена: 190030.00 T
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Описание: The main purpose of this book is to provide a comprehensive treatment of the materials aspects of group-IV, III-V and II-VI semiconductor alloys used in various electronic and optoelectronic devices.

Автор: Victor E. Borisenko
Название: Semiconducting Silicides
ISBN: 3642640699 ISBN-13(EAN): 9783642640698
Издательство: Springer
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Цена: 113190.00 T
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Описание: A comprehensive presentation and analysis of properties and methods of formation of semiconducting silicides. Fundamental electronic, optical and transport properties of the silicides collected from recent publications will help readers choose their application in new generations of solid-state devices.

Автор: K.M. Gupta; Nishu Gupta
Название: Advanced Semiconducting Materials and Devices
ISBN: 3319197576 ISBN-13(EAN): 9783319197579
Издательство: Springer
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Цена: 130610.00 T
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Описание: A wide range of topics are covered, including optoelectronic devices, metal-semiconductor junctions, heterojunctions, MISFETs, LEDs, semiconductor lasers, photodiodes, switching diodes, tunnel diodes, Gunn diodes, solar cells, varactor diodes, IMPATT diodes, and advanced semiconductors.

Автор: Richard Haight (Editor), Frances M. Ross (Editor),
Название: Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization V1
ISBN: 9814322814 ISBN-13(EAN): 9789814322812
Издательство: World Scientific Publishing
Цена: 387810.00 T
Наличие на складе: Поставка под заказ.
Описание: Nanoscience and nanotechnology is an exciting and vibrant field of research. This handbook is suitable for researchers, engineers and advanced graduate students in various areas of nanoscience. It includes information on important techniques for unlocking the detailed science and properties of nanostructures.

Автор: Wai Kin Chim
Название: Semiconductor Device and Failure Analysis : Using Photon Emission Microscopy
ISBN: 047149240X ISBN-13(EAN): 9780471492405
Издательство: Wiley
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Цена: 204810.00 T
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Описание: Fault detection has become increasingly difficult as integrated circuits become more and more complex. Photon Emission Microscopy (PEM) is a physical failure analysis technique which locates and identifies faults in integrated circuits.

Автор: Kipp van Schooten
Название: Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance
ISBN: 3319005898 ISBN-13(EAN): 9783319005898
Издательство: Springer
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Цена: 121110.00 T
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Описание: This book lays the groundwork for further use of Electron Spin Echo Envelop Modulation (ESEEM) and opens the possibility of highly precise chemical fingerprinting. It reveals an astonishingly long memory of spin coherence in semiconductor particles.

Автор: Bernard Pajot; Bernard Clerjaud
Название: Optical Absorption of Impurities and Defects in Semiconducting Crystals
ISBN: 3642430805 ISBN-13(EAN): 9783642430800
Издательство: Springer
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Цена: 121890.00 T
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Описание: This volume outlines how absorption spectroscopy is important to the investigation of deep-level centers introduced in semiconductors and insulators. It also explains how vibrational spectroscopy determines the atomic structure and symmetry of complexes.

Автор: Kipp van Schooten
Название: Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance
ISBN: 331903328X ISBN-13(EAN): 9783319033280
Издательство: Springer
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Цена: 87060.00 T
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Описание: This book lays the groundwork for further use of Electron Spin Echo Envelop Modulation (ESEEM) and opens the possibility of highly precise chemical fingerprinting. It reveals an astonishingly long memory of spin coherence in semiconductor particles.

Автор: N.Kh. Abrikosov
Название: Semiconducting II–VI, IV–VI, and V–VI Compounds
ISBN: 1489961852 ISBN-13(EAN): 9781489961853
Издательство: Springer
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Цена: 87070.00 T
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Автор: A.G. Cullis; John L. Hutchison
Название: Microscopy of Semiconducting Materials
ISBN: 3642068707 ISBN-13(EAN): 9783642068706
Издательство: Springer
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Цена: 243800.00 T
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Описание: The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy.

Автор: Paul N. Butcher; Norman H. March; Mario P. Tosi
Название: Crystalline Semiconducting Materials and Devices
ISBN: 1475799020 ISBN-13(EAN): 9781475799026
Издательство: Springer
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Цена: 186330.00 T
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Описание: The Semiconducting Bond . Construction of the Localized X by Linear Combination of n Atomic Orbitals . The Aufbau-Principle of the Crystal Structure of Semiconductors . A Building Principle for Polyanionic Structures . Chemical Bonds and Semiconductivity in Transition-Element Compounds . Electronic Band Structure .

Автор: Bengt G. Svensson
Название: Oxide Semiconductors,88
ISBN: 012396489X ISBN-13(EAN): 9780123964892
Издательство: Elsevier Science
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Цена: 190890.00 T
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Описание: Suitable for physicists, chemists, materials scientists, and device engineers in academia, scientific laboratories and modern industry.