Particle Induced Electron Emission II, D. Hasselkamp; H. Rothard; K.-O. Groeneveld; J. Ke

Автор: Michler G.H.
Название: Electron Microscopy of Polymers
ISBN: 3540363505 ISBN-13(EAN): 9783540363507
Издательство: Springer
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Цена: 130610.00 T
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Описание: There are many books on electron microscopy, however, the study of polymers by EM needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy (AFM), are given. Application of these techniques to study morphology and also properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.

Автор: David B. Williams; C. Barry Carter
Название: Transmission Electron Microscopy
ISBN: 038776500X ISBN-13(EAN): 9780387765006
Издательство: Springer
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Цена: 93130.00 T
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Описание: Illustrated in color, this work offers the necessary instructions for successful hands-on application of this versatile materials characterization technique. It also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment.

Автор: Max R?sler; Wolfram Brauer; Jacques Devooght; Jean
Название: Particle Induced Electron Emission I
ISBN: 3662149990 ISBN-13(EAN): 9783662149997
Издательство: Springer
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Цена: 87070.00 T
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Описание: This monograph discusses collision-induced electron emission from nearly free-electron metals by ion or electron impact. Several electron excitation mechanisms of electrons in the target are considered: excitation of single conduction and core electrons, excitation by plasmon decay and by Auger processes.

Автор: Cordoba Castillo, Rosa
Название: Functional nanostructures fabricated by focused electron/ion beam induced deposition
ISBN: 3319020803 ISBN-13(EAN): 9783319020808
Издательство: Springer
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Цена: 104480.00 T
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Описание: This book offers a detailed study of functional nanostructures (ferromagnetic, superconducting, metallic and semiconducting) fabricated by focused electron/ion beam induced deposition techniques.

Автор: Egerton
Название: Physical Principles of Electron Microscopy
ISBN: 0387258000 ISBN-13(EAN): 9780387258003
Издательство: Springer
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Цена: 121890.00 T
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Описание: Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

Автор: H.H. Kausch, H.G. Zachmann, G. Bodor, G. Elsner, J
Название: Characterization of Polymers in the Solid State II: Synchrotron Radiation, X-ray Scattering and Electron Microscopy (Advances in Polymer Science) (Volume 67)
ISBN: 366215966X ISBN-13(EAN): 9783662159668
Издательство: Springer
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Цена: 81050.00 T
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Автор: Goldstein
Название: Scanning Electron Microscopy and X-ray Microanalysis
ISBN: 0306472929 ISBN-13(EAN): 9780306472923
Издательство: Springer
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Цена: 93160.00 T
Наличие на складе: Невозможна поставка.
Описание: This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis.

Автор: Leo
Название: Techniques for Nuclear and Particle Physics Experiments
ISBN: 3540572805 ISBN-13(EAN): 9783540572800
Издательство: Springer
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Цена: 93160.00 T
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Описание: Treats the experimental techniques and instrumentation often used in nuclear and particle physics experiments as well as in various other experiments. This book provides useful results and formulae, technical know-how and informative details. It is intended for graduate students, scientists, engineers, and technical assistants.

Автор: Egerton
Название: Electron Energy-Loss Spectroscopy in the Electron Microscope
ISBN: 144199582X ISBN-13(EAN): 9781441995827
Издательство: Springer
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Цена: 214280.00 T
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Описание: Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level.