Organic Crystals I: Characterization, H. Klapper; Norbert Karl; M. Kobayashi; T. Kobayas

Автор: S. Loewll, J.E. Shields, M.A. Thomas And M. Thomme
Название: Characterization Of Porous Solids And Powders: Surface Area, Pore Size And Density
ISBN: 9048166330 ISBN-13(EAN): 9789048166336
Издательство: Springer
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Цена: 139750.00 T
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Описание: The growth of interest in newly developed porous materials has prompted the writing of this book for those who have the need to make meaningful measurements without the benefit of years of experience.

Автор: Miki Niwa; Naonobu Katada; Kazu Okumura
Название: Characterization and Design of Zeolite Catalysts
ISBN: 3642264476 ISBN-13(EAN): 9783642264474
Издательство: Springer
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Цена: 104480.00 T
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Описание: Catalysts based on these microporous, aluminosilicate minerals are used by chemical companies in the interconversion of hydrocarbons and the alkylation of aromatic compounds. This book characterizes the specific properties of zeolites and aids catalyst design.

Автор: Baird
Название: Manipulation and Characterization of Electrosprayed Ions Under Ambient Conditions
ISBN: 3319498681 ISBN-13(EAN): 9783319498683
Издательство: Springer
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Цена: 102480.00 T
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Описание: This thesis addresses the evolving field of measurement science, specifically that of mass spectrometry (MS) and ion mobility spectrometry (IMS) based techniques. It focuses on the design, construction and implementation of low-cost, easy-to-manufacture measurement tools that are used in modern settings such as airport security screening.

Автор: William H. Streng
Название: Characterization of Compounds in Solution
ISBN: 1461355087 ISBN-13(EAN): 9781461355083
Издательство: Springer
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Цена: 87070.00 T
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Описание: Scientists from many disciplines require making observations which are dependent upon the behavior of compounds in solution.

Автор: Ugo Valdre
Название: Surface and Interface Characterization by Electron Optical Methods
ISBN: 1461595398 ISBN-13(EAN): 9781461595397
Издательство: Springer
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Цена: 81050.00 T
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Описание: The importance of real space imaging and spatially-resolved spectroscopy in many of the most significant problems of surface and interface behaviour is almost self evident.

Автор: B.K. Tanner
Название: Characterization of Crystal Growth Defects by X-Ray Methods
ISBN: 147571128X ISBN-13(EAN): 9781475711288
Издательство: Springer
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Цена: 81050.00 T
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Описание: This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods` held in the University of Durham, England from 29th August to 10th September 1979.

Автор: Alvin W. Czanderna; Cedric J. Powell; Theodore E.
Название: Specimen Handling, Preparation, and Treatments in Surface Characterization
ISBN: 1475786018 ISBN-13(EAN): 9781475786019
Издательство: Springer
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Цена: 174150.00 T
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Описание: With the development in the 1960s of ultrahigh vacuum equipment and techniques and electron, X-ray, and ion beam techniques to determine the structure and composition of interfaces, activities in the field of surface science grew nearly exponentially.

Автор: Hatsuo Ishida; Ganesh Kumar
Название: Molecular Characterization of Composite Interfaces
ISBN: 1489922539 ISBN-13(EAN): 9781489922533
Издательство: Springer
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Цена: 174150.00 T
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Описание: This book is an extended version of the proceedings of the Symposium on Polymer Composites, Interfaces, which was held under the auspices of the Division of Polymer Chemistry, American Chemical Society (ACS) during the annual ACS meeting in Seattle, March, 1983.

Автор: V.A. Bershtein; G.C. Berry; N. Ise; J. Lesec; H. M
Название: Polymer Analysis and Characterization
ISBN: 3662149052 ISBN-13(EAN): 9783662149058
Издательство: Springer
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Цена: 113190.00 T
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