Fast Scanning Calorimetry, Schick

Автор: Goldstein
Название: Scanning Electron Microscopy and X-ray Microanalysis
ISBN: 0306472929 ISBN-13(EAN): 9780306472923
Издательство: Springer
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Цена: 93160.00 T
Наличие на складе: Невозможна поставка.
Описание: This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis.

Автор: Zhong Lin Wang, Weilie Zhou
Название: Scanning microscopy for nanotechnology
ISBN: 0387333258 ISBN-13(EAN): 9780387333250
Издательство: Springer
Рейтинг:
Цена: 174150.00 T
Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnology, in both technique and application chapters by leading practitioners. The book covers topics including nanomaterials imaging, X-ray microanalysis, high-resolution SEM, low kV SEM, cryo-SEM, as well as new techniques such as electron back scatter diffraction (EBSD) and scanning transmission electron microscopy (STEM). Fabrication techniques integrated with SEM, such as e-beam nanolithography, nanomanipulation, and focused ion beam nanofabrication, are major new dimensions for SEM application. Application areas include the study of nanoparticles, nanowires and nanotubes, three-dimensional nanostructures, quantum dots, magnetic nanomaterials, photonic structures, and bio-inspired nanomaterials. This book will appeal not only to a broad spectrum of nanomaterials researchers, but also to SEM development specialists.