X-ray and Neutron Techniques for Nanomaterials Characterization, Kumar
Автор: Klotz Название: Techniques In High Pressure Neutron ISBN: 1138199214 ISBN-13(EAN): 9781138199217 Издательство: Taylor&Francis Рейтинг: Цена: 73490.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание:
Drawing on the author's practical work from the last 20 years, Techniques in High Pressure Neutron Scattering is one of the first books to gather recent methods that allow neutron scattering well beyond 10 GPa. The author shows how neutron scattering has to be adapted to the pressure range and type of measurement.
Suitable for both newcomers and experienced high pressure scientists and engineers, the book describes various solutions spanning two to three orders of magnitude in pressure that have emerged in the past three decades. Many engineering concepts are illustrated through examples of real high pressure devices that have demonstrated their capacity and have produced scientific results.
After introducing basic engineering concepts related to the elastic and plastic behavior of cylindrical pressure devices, the text emphasizes mechanical and neutronic properties of construction materials. Subsequent chapters describe numerous high pressure techniques, including liquid/gas, clamp, and McWhan cells. The book also focuses on Paris-Edinburgh devices, high pressure metrology, and scientific applications.
Название: Handbook of instrumentation and techniques for semiconductor nanostructure characterization ISBN: 9814322806 ISBN-13(EAN): 9789814322805 Издательство: World Scientific Publishing Рейтинг: Цена: 450910.00 T Наличие на складе: Невозможна поставка. Описание: Nanoscience and nanotechnology is an exciting and vibrant field of research. This handbook is suitable for researchers, engineers and advanced graduate students in various areas of nanoscience. It includes information on important techniques for unlocking the detailed science and properties of nanostructures.
Автор: Richard Haight (Editor), Frances M. Ross (Editor), Название: Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization V1 ISBN: 9814322814 ISBN-13(EAN): 9789814322812 Издательство: World Scientific Publishing Цена: 387810.00 T Наличие на складе: Поставка под заказ. Описание: Nanoscience and nanotechnology is an exciting and vibrant field of research. This handbook is suitable for researchers, engineers and advanced graduate students in various areas of nanoscience. It includes information on important techniques for unlocking the detailed science and properties of nanostructures.
Автор: Thomas, Sabu Название: Spectroscopic Methods for Nanomaterials Characterization ISBN: 0323461409 ISBN-13(EAN): 9780323461405 Издательство: Elsevier Science Рейтинг: Цена: 179660.00 T Наличие на складе: Поставка под заказ. Описание:
Nanomaterials Characterization Techniques, Volume Two, part of an ongoing series, offers a detailed analysis of the different types of spectroscopic methods currently being used in nanocharacterization. These include, for example, the Raman spectroscopic method for the characterization of carbon nanotubes (CNTs).
This book outlines the different kinds of spectroscopic tools being used for the characterization of nanomaterials and discusses under what conditions each should be used. The book is intended to cover all the major spectroscopic techniques for nanocharacterization, making it an important resource for both the academic community at the research level and the industrial community involved in nanomanufacturing.
Автор: Thomas, Sabu Название: Microscopy Methods in Nanomaterials Characterization ISBN: 0323461417 ISBN-13(EAN): 9780323461412 Издательство: Elsevier Science Рейтинг: Цена: 179660.00 T Наличие на складе: Поставка под заказ. Описание:
Microscopy Methods in Nanomaterials Characterization fills an important gap in the literature with a detailed look at microscopic and X-ray based characterization of nanomaterials. These microscopic techniques are used for the determination of surface morphology and the dispersion characteristics of nanomaterials.
This book deals with the detailed discussion of these aspects, and will provide the reader with a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc. In addition, it covers the latest developments and trends morphological characterization using a variety of microscopes.
Materials scientists, materials engineers and scientists in related disciplines, including chemistry and physics, will find this to be a detailed, method-orientated guide to microscopy methods of nanocharacterization.
Автор: Shukla Название: EMR/ESR/EPR Spectroscopy for Characterization of Nanomaterials ISBN: 813223653X ISBN-13(EAN): 9788132236535 Издательство: Springer Рейтинг: Цена: 102480.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: The subject matter of this book is the application of EMR/ESR/EPR spectroscopy for characterization of nanomaterials. Initial chapters deal with nanomaterials and their classification. Characterization of metallic nanoparticles, metal oxide nanoparticles and rare earth impurity doped nanoparticles from the (ESR) spectrum parameters are covered in the chapters that follow. A special feature of the book is EMR/ESR/EPR spectroscopic characterization of nanoparticles which are important due to their bactericidal and anticancerous properties. Strength of continuous wave (CW) is explained with the help of suitable examples. The book focuses on applications and data interpretation avoiding extensive use of mathematics so that it also caters to the need of young scientists in the life science disciplines. The book includes a comparison with other spectroscopic characterization methods so as to give an integrated approach to the reader. It will prove useful to biomedical scientists and engineers, chemists, and materials engineers in student, researcher, and practitioner positions.
Автор: V Tewary Название: Modeling, Characterization, and Production of Nanomaterials, ISBN: 1782422285 ISBN-13(EAN): 9781782422280 Издательство: Elsevier Science Рейтинг: Цена: 258260.00 T Наличие на складе: Невозможна поставка. Описание: Part one covers modeling techniques incorporating quantum mechanical effects to simulate nanomaterials and devices. Part two describes the characterization of nanomaterials using diffraction techniques and Raman spectroscopy. Part three looks at the structure and properties of nanomaterials. Part four explores nanofabrication and nanodevices.
Автор: Mohammed Baalousha Название: Characterization of Nanomaterials in Complex Environmental and Bi ISBN: 0080999484 ISBN-13(EAN): 9780080999487 Издательство: Elsevier Science Рейтинг: Цена: 151590.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание:
Characterization of Nanomaterials in Complex Environmental and Biological Media covers the novel properties of nanomaterials and their applications to consumer products and industrial processes.
The book fills the growing gap in this challenging area, bringing together disparate strands in chemistry, physics, biology, and other relevant disciplines. It provides an overview on nanotechnology, nanomaterials, nano(eco)toxicology, and nanomaterial characterization, focusing on the characterization of a range of nanomaterial physicochemical properties of relevance to environmental and toxicological studies and their available analytical techniques.
Readers will find a multidisciplinary approach that provides highly skilled scientists, engineers, and technicians with the tools they need to understand and interpret complicated sets of data obtained through sophisticated analytical techniques.
Автор: Vikas Mittal; Nadejda B. Matsko Название: Analytical Imaging Techniques for Soft Matter Characterization ISBN: 3642429521 ISBN-13(EAN): 9783642429521 Издательство: Springer Рейтинг: Цена: 121890.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This unconventional microscopy book focuses on biological soft matter and varieties of polymer now visible via new techniques such as AFM, SEM and TEM. It provides answers to questions on characterization and covers qualitative and quantitative analysis.
Thermal and Rheological Measurement Techniques for Nanomaterials Characterization, Second Edition covers thermal and rheological measurement techniques, including their principle working methods, sample preparation and interpretation of results.
This important reference is an ideal source for materials scientists and industrial engineers who are working with nanomaterials and need to know how to determine their properties and behaviors.
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