The Mathematical Analysis of Electrical and Optical Wave-Motion, Bateman
Автор: Servin Название: Fringe Pattern Analysis for Optical Metrology - Theory, Algorithms, and Applications ISBN: 3527411526 ISBN-13(EAN): 9783527411528 Издательство: Wiley Рейтинг: Цена: 125610.00 T Наличие на складе: Поставка под заказ. Описание: The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology.
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