Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections, Cher Ming Tan; Wei Li; Zhenghao Gan; Yuejin Hou

Автор: Tan Cher Ming
Название: Electromigration In Ulsi Interconnections
ISBN: 9814273325 ISBN-13(EAN): 9789814273329
Издательство: World Scientific Publishing
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Цена: 105600.00 T
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Описание: Presents a description of the electro migration in integrated circuits. This book examines the various interconnected systems and their evolution employed in integrated circuit technology. It is suitable for readers on electro migration in ULSI interconnections.

Автор: Rosston
Название: Interconnection and the Internet
ISBN: 0805828486 ISBN-13(EAN): 9780805828481
Издательство: Taylor&Francis
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Цена: 51030.00 T
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Описание: 3rd volume of proceedings from TPRC

Автор: Ibe
Название: Environmental Radiation Effects in ULSI Devices and Electronic Systems
ISBN: 1118479297 ISBN-13(EAN): 9781118479292
Издательство: Wiley
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Цена: 127720.00 T
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Описание: This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions.