Scanning Probe Microscopy for Energy Research, Bonnell Dawn A
Автор: Patrick Echlin Название: Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis ISBN: 0387857303 ISBN-13(EAN): 9780387857305 Издательство: Springer Рейтинг: Цена: 97820.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
Автор: Goldstein Название: Scanning Electron Microscopy and X-ray Microanalysis ISBN: 0306472929 ISBN-13(EAN): 9780306472923 Издательство: Springer Рейтинг: Цена: 93160.00 T Наличие на складе: Невозможна поставка. Описание: This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis.
Автор: Stokes Название: Principles and Practice of Variable Pressure: Environmental Scanning Electron Microscopy (VP-ESEM) ISBN: 0470065400 ISBN-13(EAN): 9780470065402 Издательство: Wiley Рейтинг: Цена: 71750.00 T Наличие на складе: Поставка под заказ. Описание: * Offers a simple starting point to VPSEM, especially for new users, technicians and students containing clear, concise explanations * Crucially, the principles and applications outlined in this book are completely generic: i.e. applicable to all types of VPSEM, irrespective of manufacturer.
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