X-Ray Diffraction, A Practical Approach, Suryanarayana, C., Norton, M. Grant

Автор: Will Georg
Название: Powder Diffraction / The Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Data
ISBN: 3540279857 ISBN-13(EAN): 9783540279853
Издательство: Springer
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Цена: 130610.00 T
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Описание: Crystal structure analysis from powder diffraction data has attracted considerable and ever growing interest in the last decades. X-ray powder diffraction is best known for phase analysis (Hanawalt files) dating back to the 30s. In the late 60s the inherent potential of powder diffraction for crystallographic problems was realized and scientists developed methods for using powder diffraction data at first only for the refinement of crystal structures. With the development of ever growing computer power profile fitting and pattern decomposition allowed to extract individual intensities from overlapping diffraction peaks opening the way to many other applications, especially to ab initio structure determination. Powder diffraction today is used in X-ray and neutron diffraction, where it is a powerful method in neutron diffraction for the determination of magnetic structures. In the last decade the interest has dramatically improved. There is hardly any field of crystallography where the Rietveld, or full pattern method has not been tried with quantitative phase analysis the most important recent application.

Автор: Hammond, Christopher
Название: The Basics of Crystallography and Diffraction
ISBN: 0198738684 ISBN-13(EAN): 9780198738688
Издательство: Oxford Academ
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Цена: 53850.00 T
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Описание: Crystallography and diffraction are widely used throughout science for studying structure. The aim of this book is to show, through relevant examples and without relying on complex mathematics, that the basic ideas behind crystallography and diffraction are simple and easily comprehensible.

Автор: Pecharsky, Vitalij K. Zavalij, Peter
Название: Fundamentals of powder diffraction and structural characterization of materials. 2 ed.
ISBN: 0387095780 ISBN-13(EAN): 9780387095783
Издательство: Springer
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Цена: 102480.00 T
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Описание: A little over ?ve years have passed since the ?rst edition of this book appeared in print. Seems like an instant but also eternity, especially considering numerous developments in the hardware and software that have made it from the laboratory test beds into the real world of powder diffraction.