Semiconductor Radiation Detectors / Device Physics, Lutz Gerhard
Автор: Wai Kin Chim Название: Semiconductor Device and Failure Analysis : Using Photon Emission Microscopy ISBN: 047149240X ISBN-13(EAN): 9780471492405 Издательство: Wiley Рейтинг: Цена: 204810.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Fault detection has become increasingly difficult as integrated circuits become more and more complex. Photon Emission Microscopy (PEM) is a physical failure analysis technique which locates and identifies faults in integrated circuits.
Автор: Cooper Название: Introduction to Nuclear Radiation Detectors ISBN: 0521281326 ISBN-13(EAN): 9780521281324 Издательство: Cambridge Academ Рейтинг: Цена: 47520.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This 1986 book is an introduction to the then commonly used types of detectors of nuclear radiation. The author opens with an introduction to the properties and characteristics of ionising radiations. The main body of text, however, comprises a description of the construction, operation and main applications of gas-filled, scintillation and semiconductor detectors.
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