Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties, Dahoo Pierre Richard, Pougnet Philippe, El Hami Abdelkhalak
Автор: Dahoo Pierre Richard, Pougnet Philippe, El Hami Abdelkhalak Название: Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and Rbdo Method ISBN: 1786306875 ISBN-13(EAN): 9781786306876 Издательство: Wiley Рейтинг: Цена: 145670.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Nanoscience, nanotechnologies and the laws of quantum physics are sources of disruptive innovation that open up new fields of application. Quantum engineering enables the development of very sensitive materials, sensor measurement systems and computers. Quantum computing, which is based on two-level systems, makes it possible to manufacture computers with high computational power.
This book provides essential knowledge and culminates with an industrial application of quantum engineering and nanotechnologies. It presents optical systems for measuring at the nanoscale, as well as quantum physics models that describe how a two-state system interacts with its environment. The concept of spin and its derivation from the Dirac equation is also explored, while theoretical foundations and example applications aid in understanding how a quantum gate works. Application of the reliability-based design optimization (RBDO) method of mechanical structures is implemented, in order to ensure reliability of estimates from the measurement of mechanical properties of carbon nanotube structures.
This book provides valuable support for teachers and researchers but is also intended for engineering students, working engineers and Master s students.
Автор: Mihir K. Chakraborty; Andrzej Skowron; Manoranjan Название: Facets of Uncertainties and Applications ISBN: 8132223004 ISBN-13(EAN): 9788132223009 Издательство: Springer Рейтинг: Цена: 130430.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: It has been shown that several mathematical concepts such as the theory of fuzzy sets, theory of rough sets, evidence theory, possibility theory, theory of complex systems and complex network, theory of fuzzy measures and uncertainty theory can also successfully model uncertainty.
Автор: Abdelkhalak El Hami, Bouchaib Radi Название: Fluid-Structure Interactions and Uncertainties: Ansys and Fluent Tools ISBN: 1848219393 ISBN-13(EAN): 9781848219397 Издательство: Wiley Рейтинг: Цена: 146730.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book is dedicated to the general study of fluid structure interaction with consideration of uncertainties. The fluid-structure interaction is the study of the behavior of a solid in contact with a fluid, the response can be strongly affected by the action of the fluid.
This book, discusses the latest research on the intelligent control of two important components in smart grids, namely microgrids (MGs) and electric vehicles (EVs). It focuses on developing theoretical frameworks and proposing corresponding algorithms, to optimally schedule virtualized elements under different uncertainties so that the total cost of operating the microgrid or the EV charging system can be minimized and the systems maintain stabilized. With random factors in the problem formulation and corresponding designed algorithms, it provides insights into how to handle uncertainties and develop rational strategies in the operation of smart grid systems. Written by leading experts, it is a valuable resource for researchers, scientists and engineers in the field of intelligent management of future power grids.
Автор: Ran Wang; Ping Wang; Gaoxi Xiao Название: Intelligent Microgrid Management and EV Control under Uncertainties in Smart Grid ISBN: 9811042497 ISBN-13(EAN): 9789811042492 Издательство: Springer Рейтинг: Цена: 111790.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book, discusses the latest research on the intelligent control of two important components in smart grids, namely microgrids (MGs) and electric vehicles (EVs).
Автор: Dahoo Название: Nanometer-scale Defect Detection Using Polarized Light ISBN: 1848219369 ISBN-13(EAN): 9781848219366 Издательство: Wiley Рейтинг: Цена: 146730.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.
Автор: Servin Название: Fringe Pattern Analysis for Optical Metrology - Theory, Algorithms, and Applications ISBN: 3527411526 ISBN-13(EAN): 9783527411528 Издательство: Wiley Рейтинг: Цена: 125610.00 T Наличие на складе: Поставка под заказ. Описание: The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology.
Автор: P. Avouris Название: Atomic and Nanometer-Scale Modification of Materials ISBN: 9401048959 ISBN-13(EAN): 9789401048958 Издательство: Springer Рейтинг: Цена: 81050.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: This volume contains the proceedings of the conference on "Atomic and Nanometer Scale Modification of Materials: Fundamentals and Applications" which was co-sponsored by NATO and the Engineering Foundation, and took place in Ventura, California in August 1992.
Автор: Hockett, Paul Название: Quantum metrology with photoelectrons, volume ii: applications and advances ISBN: 1681746891 ISBN-13(EAN): 9781681746890 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 56370.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging applications.Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on ""complete"" photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.
Автор: Kevin Harding, Song Zhang Название: Dimensional Optical Metrology and Inspection for Practical Applications VII ISBN: 1510618457 ISBN-13(EAN): 9781510618459 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 71150.00 T Наличие на складе: Невозможна поставка. Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Автор: Hockett, Paul Название: Quantum metrology with photoelectrons, volume ii: applications and advances ISBN: 1643270001 ISBN-13(EAN): 9781643270005 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 76690.00 T Наличие на складе: Есть у поставщика Поставка под заказ. Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging applications.Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on ""complete"" photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.
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